المؤلفون: Li, M., Mikki, S., Uzoma, P.C., Penkov, O.V.

المصدر: IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 70(4):650-658 Apr, 2023

المؤلفون: Singh, Anchal Kishore, Yadav, Bhim Sen, Vishwakarma, Anand Kumar, Kumar, Sarvesh, Ahmad, Faizan, Kumar, Pramod, Kumar, Naresh^{Aff1, IDs1166402310635z_cor7}

المصدر: Journal of Electronic Materials. 52(11):7132-7142

المؤلفون: Lenshin, Alexander, Peshkov, Yaroslav, Velichko, Kirill, Kannykin, Sergey

المصدر: 2021 International Conference on Information Technology and Nanotechnology (ITNT) Information Technology and Nanotechnology (ITNT), 2021 International Conference on. :1-4 Sep, 2021

Relation: 2021 International Conference on Information Technology and Nanotechnology (ITNT)

المؤلفون: Sharma, Vishal, Arora, Sunil K., Sunidhi, Sanchez, Florencio

المصدر: 2020 5th IEEE International Conference on Emerging Electronics (ICEE) Emerging Electronics (ICEE), 2020 5th IEEE International Conference on. :1-3 Nov, 2020

Relation: 2020 5th IEEE International Conference on Emerging Electronics (ICEE)

المؤلفون: Kashyap, Ritayan, Chakraborty, Soumik, Swarnakar, Sikha, Humbert, Georges, Zeng, Shuwen, Mondal, Biplob

المصدر: 2019 IEEE International Conference on Electrical, Computer and Communication Technologies (ICECCT) Electrical, Computer and Communication Technologies (ICECCT), 2019 IEEE International Conference on. :1-4 Feb, 2019

Relation: 2019 IEEE International Conference on Electrical, Computer and Communication Technologies (ICECCT)

المؤلفون: R.B. Tokas, S. Jena, C. Prathap, S. Thakur, K. Divakar Rao, D.V. Udupa

المصدر: Applied Surface Science Advances, Vol 18, Iss , Pp 100480- (2023)

مصطلحات موضوعية: Tantalum penta oxide thin films, Electron beam deposition, Spectroscopic ellipsometry, Atomic force microscopy, Grazing incidence X-ray reflectivity, Materials of engineering and construction. Mechanics of materials, TA401-492, Industrial electrochemistry, TP250-261

وصف الملف: electronic resource

Relation: http://www.sciencedirect.com/science/article/pii/S2666523923001149; https://doaj.org/toc/2666-5239

URL الوصول: https://doaj.org/article/1729ce6c6f5248f9ae10c062673f17db

المؤلفون: Saffron J. Bryant, Zo L. Shaw, Louisa Z. Y. Huang, Aaron Elbourne, Amanda N. Abraham, Jitraporn Vongsvivut, Stephen A. Holt, Tamar L. Greaves, Gary Bryant

المصدر: Biophysica, Vol 3, Iss 2, Pp 318-334 (2023)

مصطلحات موضوعية: deep eutectic solvents, ionic liquids, cryoprotectants, ATR–FTIR, cell toxicity, X-ray reflectivity, Biology (General), QH301-705.5

وصف الملف: electronic resource

Relation: https://www.mdpi.com/2673-4125/3/2/21; https://doaj.org/toc/2673-4125

URL الوصول: https://doaj.org/article/13f4dba676af4104b7fa26c2488e98ba

المؤلفون: Lee, Sang Soo, Koishi, Ayumi, Bourg, Ian C, Fenter, Paul

المصدر: Proceedings of the National Academy of Sciences of the United States of America. 118(32)

مصطلحات موضوعية: Physical Sciences, Condensed Matter Physics, EDL, adsorption, salinity, X-ray reflectivity, molecular dynamics

وصف الملف: application/pdf

URL الوصول: https://escholarship.org/uc/item/4073t62z
https://escholarship.org/content/qt4073t62z/qt4073t62z.pdf

المؤلفون: Stendahl, Sjoerd, Ghafoor, Naureen, Schwartzkopf, Matthias, Zubayer, Anton, Birch, Jens, Eriksson, Fredrik

المصدر: ACS Applied Materials and Interfaces. 16(17):22665-22675

مصطلحات موضوعية: neutron optics, Ni/Ti, multilayer, ion-assisted magnetron sputter deposition, grazing-incidencesmall-angle X-ray scattering, GISAXS, interfacemorphology, neutron reflectivity, X-ray reflectivity

وصف الملف: print

URL الوصول: https://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-205185

المؤلفون: Sahoo, Ajit Kumar, Chelvane, J. Arout, Mohanty, J.^{Aff1, IDs0033902306678y_cor3}

المصدر: Applied Physics A: Materials Science & Processing. 129(6)