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المؤلفون: C. Doyen, V. Yon, X. Garros, L. Basset, T. Mota Frutuoso, C. Dagon, C. Diouf, X. Federspiel, V. Millon, F. Monsieur, C. Pribat, D. Roy
المصدر: 2023 IEEE International Reliability Physics Symposium (IRPS).
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::5d32e8a84fd239457ce9b37d14af3dbf
https://doi.org/10.1109/irps48203.2023.10117681 -
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المؤلفون: T. Mota Frutuoso, X. Garros, P. Batude, L. Brunet, J. Lacord, B. Sklenard, V. Lapras, C. Fenouillet-Beranger, M. Ribotta, A. Magalhaes-Lucas, J. Kanyandekwe, R. Kies, G. Romano, E. Catapano, M. Casse, J. Lugo-Alvarez, P. Ferrari, F. Gaillard
المساهمون: Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information (CEA-LETI), Direction de Recherche Technologique (CEA) (DRT (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA), Reliable RF and Mixed-signal Systems (TIMA-RMS), Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés (TIMA), Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP ), Université Grenoble Alpes (UGA)-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP ), Université Grenoble Alpes (UGA), IEEE
المصدر: IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits 2022)
IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits 2022), Jun 2022, Honolulu (HI), United States. ⟨10.1109/VLSITechnologyandCir46769.2022.9830504⟩
IEEELinkمصطلحات موضوعية: resistance, silicon-on-insulator, three-dimensional displays, VLSI (Very Large Scale Integration), PACS 85.42, capacitance, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, predictive models, performance evaluation
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::9eef2750dbb3aeee813a581581b63000
https://hal.science/hal-04069091 -
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المؤلفون: J. Hai, F. Cacho, A. Divay, E. Lauga-Larroze, J.-D. Arnould, J. Forest, V. Knopik, X. Garros
المساهمون: STMicroelectronics, Reliable RF and Mixed-signal Systems (TIMA-RMS), Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés (TIMA), Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP ), Université Grenoble Alpes (UGA)-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP ), Université Grenoble Alpes (UGA), Département d'Architectures, Conception et Logiciels Embarqués-LETI (DACLE-LETI), Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information (CEA-LETI), Direction de Recherche Technologique (CEA) (DRT (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Direction de Recherche Technologique (CEA) (DRT (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université Grenoble Alpes (UGA), ST Microélectronics, ST Microélectronic, IEEE
المصدر: IEEE International Reliability Physics Symposium (IRPS 2022)
IEEE International Reliability Physics Symposium (IRPS 2022), IEEE, Mar 2022, Dallas, United States. pp.4B.2-1-4B.2-6, ⟨10.1109/IRPS48227.2022.9764535⟩مصطلحات موضوعية: sensitivity analysis, power amplifier, RF reliability, CMOS SOI, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, Hot-Carrier Injection (HCI)
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f2f0a1ad5c79ec0c35e254af09504e2c
https://hal.science/hal-04050556 -
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المؤلفون: M. Arabi, X. Federspiel, F. Cacho, M. Rafik, S. Blonkowski, X. Garros, G. Guibaudo
المصدر: 2022 IEEE International Reliability Physics Symposium (IRPS).
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::1397572ba71a75cfa6828bd3f0c6ed4a
https://doi.org/10.1109/irps48227.2022.9764503 -
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المؤلفون: P. Batude, O. Billoint, S. Thuries, P. Malinge, C. Fenouillet-Beranger, A. Peizerat, G. Sicard, P. Vivet, S. Reboh, C. Cavalcante, L. Brunet, M. Ribotta, L. Brevard, X. Garros, T. Mota Frutuoso, B. Sklenard, J. Lacord, J. Kanyandekwe, S. Kerdiles, P. Sideris, C. Theodorou, V. Lapras, M. Mouhdach, G. Gaudin, G. Besnard, I. Radu, F. Ponthenier, A. Farcy, E. Jesse, F. Guyader, T. Matheret, P. Brunet, F. Milesi, L. Le Van-Jodin, A. Sarrazin, B. Perrin, C. Moulin, S. Maitrejean, M. Alepidis, I. Ionica, S. Cristoloveanu, F. Gaillard, M. Vinet, F. Andrieu, J. Arcamone, E. Ollier
المصدر: 2021 IEEE International Electron Devices Meeting (IEDM).
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::a954addef7e27e3dfae349b36fd38937
https://doi.org/10.1109/iedm19574.2021.9720671 -
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المؤلفون: A. Divay, J. Forest, V. Knopik, J. Hai, N. Revil, J. Antonijevic, A. Michard, F. Cacho, E. Vincent, F. Gaillard, X. Garros
المصدر: 2021 IEEE International Electron Devices Meeting (IEDM).
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::95925e65eaf529a86727f0dc1357e1eb
https://doi.org/10.1109/iedm19574.2021.9720531 -
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المؤلفون: R. Kom Kammeugne, C. Leroux, T. Mota Frutuoso, J. Cluzel, L. Vauche, C. Le Royer, R. Gwoziecki, X. Garros, F. Gaillard, M. Charles, E. Bano, G. Ghibaudo
المصدر: ESSDERC 2021 - IEEE 51st European Solid-State Device Research Conference (ESSDERC).
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::c6d94ca0e60d5a44939ec6f9faa39f86
https://doi.org/10.1109/essderc53440.2021.9631820 -
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المؤلفون: F. Gaillard, C. Fenouillet-Beranger, X. Garros, Joris Lacord, Jose Lugo-Alvarez, Louis Gerrer, M. Casse, Philippe Ferrari, Laurent Brunet, E. Catapano, Francois Andrieu, T. Mota Frutuoso
المصدر: IRPS
مصطلحات موضوعية: Materials science, Silicon, business.industry, Interface (computing), Transistor, Oxide, chemistry.chemical_element, Silicon on insulator, Temperature measurement, law.invention, chemistry.chemical_compound, Reliability (semiconductor), chemistry, law, Optoelectronics, Degradation (geology), business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b798b8f9f057b1cb27f5e46793857d71
https://doi.org/10.1109/irps46558.2021.9405107 -
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المؤلفون: F. Gaillard, Xavier Federspiel, X. Garros, Florian Cacho, J. Cluzel, Louis Gerrer, Emmanuel Vincent, David Roy
المصدر: IRPS
مصطلحات موضوعية: Stress (mechanics), Work (thermodynamics), Reliability (semiconductor), business.industry, Computer science, Limit (music), Microelectronics, business, Temperature measurement, Simulation, Degradation (telecommunications), Time–frequency analysis
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b13931d1cb5e6c5aa39e460453684da3
https://doi.org/10.1109/irps46558.2021.9405145 -
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المؤلفون: G. Bertrand, E. Granger, A. Giry, X. Garros, Emmanuel Vincent, J. Lugo, J. Cluzel, Xavier Federspiel, V. Knopik, A. Divay, Florian Cacho, F. Gaillard, Nathalie Revil
المصدر: 2019 IEEE International Electron Devices Meeting (IEDM).
مصطلحات موضوعية: Power-added efficiency, Computer science, business.industry, Amplifier, Transistor, Electrical engineering, law.invention, Power (physics), Reliability (semiconductor), law, Power semiconductor device, Very High Level, business, 5G
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::ac51ba5a3c34d22e8706ffea36f6feaa
https://doi.org/10.1109/iedm19573.2019.8993649