المؤلفون: Wang, Wen-Qi, Liu, Xiang, Yu, Yong, Xiao, De-Yuan, Ba, Lan-Song, Liang, Hong-Gang, Liang, Jing, Jeon, Jong-Sung, Su, Xing-Song, Han, Qing-Hua, Zhu, Jing-Fei, Meng, Jing-Heng, Dai, Jin, Sun, Hong-Bo, Wang, Gui-Lei, Tang, Yan-Zhe, Li, Hong-Wen, Xu, Wei-Feng, Kang, Bryan, Yoo, Abraham, Cao, Kan-Yu, Zhao, Chao

المصدر: 2022 IEEE 16th International Conference on Solid-State & Integrated Circuit Technology (ICSICT) Solid-State & Integrated Circuit Technology (ICSICT), 2022 IEEE 16th International Conference on. :1-3 Oct, 2022

Relation: 2022 IEEE 16th International Conference on Solid-State & Integrated Circuit Technology (ICSICT)

المؤلفون: Zhu, Zheng-Yong, Kang, Bok-Moon, Dan, Wang, Wu, Xie-Shuai, Son, Joohwan, Yu, Yong, Xiao, De-Yuan, Dai, Jin, Wang, Gui-Lei, Yoo, Abraham, Cao, Kan-Yu, Zhao, Chao

المصدر: 2022 IEEE 16th International Conference on Solid-State & Integrated Circuit Technology (ICSICT) Solid-State & Integrated Circuit Technology (ICSICT), 2022 IEEE 16th International Conference on. :1-3 Oct, 2022

Relation: 2022 IEEE 16th International Conference on Solid-State & Integrated Circuit Technology (ICSICT)

المؤلفون: Yong, Yu, Liang, Jing, Yang, Nan, Xiao, De-Yuan, Jiang, Jian-Peng, Guo, Jing-Rui, Wang, Ling-Fei, Geng, Di, Ba, Lan-Song, Liang, Hong-Gang, Lu, Ya-Nan, Wang, Dan, Li, Yu-Ke, Yin, Xiao-Ming, Huang, Long, Shi, Jiang-Liu, Wang, Gui-Lei, Tang, Yan-Zhe, Li, Hong-Wen, Kang, Bryan, Yoo, Abraham, Cao, Kan-Yu, Li, Ling, Zhao, Chao

المصدر: 2022 IEEE 16th International Conference on Solid-State & Integrated Circuit Technology (ICSICT) Solid-State & Integrated Circuit Technology (ICSICT), 2022 IEEE 16th International Conference on. :1-3 Oct, 2022

Relation: 2022 IEEE 16th International Conference on Solid-State & Integrated Circuit Technology (ICSICT)

المؤلفون: Liang, Hong-Gang, Yu, Yong, Xiao, De-Yuan, Zhu, Jing-Fei, Liang, Jing, Ba, Lan-Song, Leng, Ji-Bin, Zhu, Zheng-Yong, Li, Yong-Jie, Su, Xing-Song, Weng, Kobe, Bai, Li, Tang, Yan-Zhe, Sun, Hong-Bo, Wang, Gui-Lei, Li, Hong-Wen, Xu, Wei-Feng, Kang, Bryan, Yoo, Abraham, Cao, Kan-Yu, Zhao, Chao

المصدر: 2022 IEEE 16th International Conference on Solid-State & Integrated Circuit Technology (ICSICT) Solid-State & Integrated Circuit Technology (ICSICT), 2022 IEEE 16th International Conference on. :1-3 Oct, 2022

Relation: 2022 IEEE 16th International Conference on Solid-State & Integrated Circuit Technology (ICSICT)

المؤلفون: Lu, Wendong, Zhu, Zhengyong, Chen, Kaifei, Liu, Menggan, Kang, Bok-Moon, Duan, Xinlv, Niu, Jiebin, Liao, Fuxi, Dan, Wang, Wu, Xie-Shuai, Son, Joohwan, Xiao, De-Yuan, Wang, Gui-Lei, Yoo, Abraham, Cao, Kan-Yu, Geng, Di, Lu, Nianduan, Yang, Guanhua, Zhao, Chao, Li, Ling, Liu, Ming

المصدر: 2022 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2022 International. :26.4.1-26.4.4 Dec, 2022

Relation: 2022 IEEE International Electron Devices Meeting (IEDM)

المؤلفون: Shu Yi Xie, Hong Zhong Shan, Peng Shi Min, Zhou Ming, Xiao De Yuan

المصدر: Microelectronics Reliability. 57:86-92

مصطلحات موضوعية: 010302 applied physics, Materials science, Scanning electron microscope, Analytical chemistry, 02 engineering and technology, Dielectric, RC time constant, 021001 nanoscience & nanotechnology, Condensed Matter Physics, 01 natural sciences, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, X-ray reflectivity, Ellipsometry, Transmission electron microscopy, Plasma-enhanced chemical vapor deposition, 0103 physical sciences, Electrical and Electronic Engineering, Fourier transform infrared spectroscopy, 0210 nano-technology, Safety, Risk, Reliability and Quality

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::6ad65ae371ef8ff91514c5d3712da27f
https://doi.org/10.1016/j.microrel.2015.12.001