المؤلفون: Kyong-Hee Joo, Xiofeng Wang, Jeong Hee Han, Seung-Hyun Lim, Seung-Jae Baik, Yong-Won Cha, Jin Wook Lee, In-Seok Yeo, Young-Kwan Cha, In Kyeong Yoo, U-In Chung, Joo Tae Moon, Byung-Il Ryu

المصدر: IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. International Electron Devices Meeting 2005 Electron Devices Meeting, 2005. IEDM Technical Digest. IEEE International. :4 pp.-868 2005

Relation: International Electron Devices Meeting 2005

المؤلفون: Yuxing Bai, Song Li, Xiofeng Wang, Yajiang Yin, Hailiang Sha

المصدر: American journal of orthodontics and dentofacial orthopedics : official publication of the American Association of Orthodontists, its constituent societies, and the American Board of Orthodontics. 145(1)

مصطلحات موضوعية: Male, Adolescent, Sialoglycoproteins, Root Resorption, Dentistry, Orthodontics, Enzyme-Linked Immunosorbent Assay, Root resorption, Sensitivity and Specificity, Orthodontics, Corrective, Crevicular fluid, Young Adult, stomatognathic system, Spectrophotometry, medicine, Humans, Detection limit, Extracellular Matrix Proteins, Chromatography, medicine.diagnostic_test, business.industry, Chemistry, Significant difference, Late stage, Reproducibility of Results, Electrochemical Techniques, Gingival Crevicular Fluid, medicine.disease, Phosphoproteins, Resorption, Incisor, stomatognathic diseases, Immunoassay, Female, business, Biomarkers

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::991cd8599aa8ba7f04e4ba9b3e2aaab7
https://pubmed.ncbi.nlm.nih.gov/24373653

المؤلفون: Byung-I Ryu, Joo Tae Moon, Sung-Nam Lee, In-Seok Yeo, Chang-Rok Moon, Jun Kyu Yang, Kyong-Hee Joo, Okhyun Nam, Duck-Hyung Lee, U-In Chung, Xiofeng Wang

المصدر: 2006 International Electron Devices Meeting.

مصطلحات موضوعية: Trap (computing), Materials science, business.industry, Memory window, Zinc compounds, Charge loss, Optoelectronics, Charge (physics), Image sensor, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::de98fe124d2e170e807e597eea9e1563
https://doi.org/10.1109/iedm.2006.346950

المؤلفون: Seung-Hyun Lim, Young-Kwan Cha, Byung-Il Ryu, Yong-Won Cha, In Kyeong Yoo, Seung Jae Baik, Xiofeng Wang, In-Seok Yeo, Jin-Wook Lee, Jeong Hee Han, U-In Chung, Kyong-Hee Joo, Joo Tae Moon

المصدر: IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest..

مصطلحات موضوعية: Materials science, business.industry, Oxide, Window (computing), Dielectric, Flash memory, Matrix (mathematics), chemistry.chemical_compound, Nanocrystal, chemistry, Electronic engineering, Optoelectronics, business, Metal gate, Quantum tunnelling

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::fd35d23eb5698c019f698ae1a4dc67c8
https://doi.org/10.1109/iedm.2005.1609494

المؤلفون: Kyong-Hee Joo, Chang-Rok Moon, Sung-Nam Lee, Xiofeng Wang, Jun Kyu Yang, In-Seok Yeo, Duckhyung Lee, Okhyun Nam, U-In Chung, Joo Tae Moon, Byung-Il Ryu

المصدر: 2006 International Electron Devices Meeting; 2006, p1-4, 4p