يعرض 1 - 10 نتائج من 400 نتيجة بحث عن '"Xu, Hong-wei"', وقت الاستعلام: 1.09s تنقيح النتائج
  1. 1
    مؤتمر
    An Influential Node Identification Framework in the Aircraft Assembly Network Based on the Community Structure

    المؤلفون: Hu, Jin-Hua, Sun, Yan-Ning, Xu, Hong-Wei, Tan, Run-Zhi, Zhu, Ji-Yue, Qin, Wei

    المصدر: 2023 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM) Industrial Engineering and Engineering Management (IEEM), 2023 IEEE International Conference on. :1411-1415 Dec, 2023

    Relation: 2023 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM)

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  2. 2
    مؤتمر
    A Framework of Direct Correlation Identification for Wafer Fault Detection

    المؤلفون: Xu, Hong-Wei, Tan, Run-Zhi, Chen, Qun-Long, Zhou, Yu, Qin, Wei

    المصدر: 2023 IEEE 19th International Conference on Automation Science and Engineering (CASE) Automation Science and Engineering (CASE), 2023 IEEE 19th International Conference on. :1-6 Aug, 2023

    Relation: 2023 IEEE 19th International Conference on Automation Science and Engineering (CASE)

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  3. 3
    مؤتمر
    A Data-Driven Status Division Scheme for Automated Container Terminal Production Process based on Graph Information

    المؤلفون: Tan, Run-Zhi, Zhang, Zhan-Luo, Sun, Yan-Ning, Xu, Hong-Wei, Qin, Wei, Tian, Yu, Xu, Dong

    المصدر: 2023 IEEE 19th International Conference on Automation Science and Engineering (CASE) Automation Science and Engineering (CASE), 2023 IEEE 19th International Conference on. :1-7 Aug, 2023

    Relation: 2023 IEEE 19th International Conference on Automation Science and Engineering (CASE)

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  4. 4
    مؤتمر
    Causality-based Prediction Method for the Diesel Engine Assembly Line System

    المؤلفون: Hu, Jin-Hua, Sun, Yan-Ning, Xu, Hong-Wei, Zhang, Zhan-Luo, Qin, Wei, Li, Xin-Yu

    المصدر: 2022 IEEE 18th International Conference on Automation Science and Engineering (CASE) Automation Science and Engineering (CASE), 2022 IEEE 18th International Conference on. :199-204 Aug, 2022

    Relation: 2022 IEEE 18th International Conference on Automation Science and Engineering (CASE)

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  5. 5
    دورية أكاديمية
    Attention mechanism-based deep learning for heat load prediction in blast furnace ironmaking process

    المؤلفون: Xu, Hong-Wei, Qin, WeiAff1, IDs10845023021063_cor2, Sun, Yan-Ning, Lv, You-Long, Zhang, Jie

    المصدر: Journal of Intelligent Manufacturing. 35(3):1207-1220

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  6. 6
    مؤتمر
    Two-Stage Quality Assessment Method of Power Equipment X-Ray Image Based on Improved CenterNet

    المؤلفون: Zhou, Jing-bo, Zhang, Rui-qi, Hao, Kun-kun, Li, Hui-bin, Li, Peng-wu, Liu, Rong-hai, Guo, Xin-liang, Zheng, Xin, Yang, Ying-Chun, Xu, Hong-wei, Chen, Guo-kun, Dai, Ke-shun, Jiao, Zong-han, Cai, Xiao-bin

    المصدر: 2021 IEEE Far East NDT New Technology & Application Forum (FENDT) New Technology & Application Forum (FENDT), 2021 IEEE Far East NDT. :196-207 Dec, 2021

    Relation: 2021 IEEE Far East NDT New Technology & Application Forum (FENDT)

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  7. 7
    مؤتمر
    Modelling and Prediction of Injection Molding Process Using Copula Entropy and Multi-Output SVR

    المؤلفون: Sun, Yan-Ning, Chen, Yu, Wang, Wu-Yin, Xu, Hong-Wei, Qin, Wei

    المصدر: 2021 IEEE 17th International Conference on Automation Science and Engineering (CASE) Automation Science and Engineering (CASE), 2021 IEEE 17th International Conference on. :1677-1682 Aug, 2021

    Relation: 2021 IEEE 17th International Conference on Automation Science and Engineering (CASE)

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  8. 8
    دورية أكاديمية
    A fast ramp-up framework for wafer yield improvement in semiconductor manufacturing systems

    المؤلفون: Xu, Hong-Wei, Zhang, Qi-Hua, Sun, Yan-Ning, Chen, Qun-Long, Qin, Wei, Lv, You-Long, Zhang, Jie

    المصدر: In Journal of Manufacturing Systems October 2024 76:222-233

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  9. 9
    دورية أكاديمية
    An adaptive Copula function-based framework for fault detection in semiconductor wafer fabrication

    المؤلفون: Xu, Hong-Wei, Qin, Wei, Sun, Yan-Ning, Lv, You-Long, Zhang, Jie

    المصدر: In Computers & Industrial Engineering February 2024 188

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  10. 10
    دورية أكاديمية
    A Copula network deconvolution-based direct correlation disentangling framework for explainable fault detection in semiconductor wafer fabrication

    المؤلفون: Xu, Hong-Wei, Qin, Wei, Hu, Jin-Hua, Sun, Yan-Ning, Lv, You-Long, Zhang, Jie

    المصدر: In Advanced Engineering Informatics January 2024 59

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