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1دورية أكاديمية
المؤلفون: Chong Fan, Xushuai Chen, Lei Zhong, Min Zhou, Yun Shi, Yulin Duan
المصدر: Sensors, Vol 17, Iss 3, p 623 (2017)
مصطلحات موضوعية: super-resolution reconstruction, large-scale image, Wallis dodging, overlapping region, optimal seam line, seam elimination, Chemical technology, TP1-1185
وصف الملف: electronic resource
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2
المؤلفون: Na Chu, Chunjia Luo, Xushuai Chen, Liuxin Li, Chaobo Liang, Min Chao, Luke Yan
المصدر: Journal of Alloys and Compounds. 955:170241
مصطلحات موضوعية: Mechanics of Materials, Mechanical Engineering, Materials Chemistry, Metals and Alloys
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3
المؤلفون: Liuxin Li, Chunjia Luo, Xushuai Chen, Na Chu, Le Li, Min Chao, Luke Yan
المصدر: Advanced Functional Materials. :2213974
مصطلحات موضوعية: Biomaterials, Electrochemistry, Condensed Matter Physics, Electronic, Optical and Magnetic Materials
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4
المؤلفون: Yangyang Feng, Chunjia Luo, Xushuai Chen, Jincui Gu, Yanmei Zhang, Min Chao, Mengru Li, Tao Chen, Xi Chen, Xun Wang, Luke Yan
المصدر: Chemical Engineering Journal. 440:135910
مصطلحات موضوعية: General Chemical Engineering, Environmental Chemistry, General Chemistry, Industrial and Manufacturing Engineering
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5
المؤلفون: Yanmei Zhang, Xushuai Chen, Chunjia Luo, Jincui Gu, Mengru Li, Min Chao, Xi Chen, Tao Chen, Luke Yan, Xun Wang
المصدر: Advanced Functional Materials. 32:2111660
مصطلحات موضوعية: Biomaterials, Electrochemistry, Condensed Matter Physics, Electronic, Optical and Magnetic Materials
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6
المؤلفون: Min Zhou, Yun Shi, Chong Fan, Xushuai Chen, Lei Zhong, Yulin Duan
المصدر: Sensors; Volume 17; Issue 3; Pages: 623
Sensors (Basel, Switzerland)
Sensors, Vol 17, Iss 3, p 623 (2017)مصطلحات موضوعية: Wallis dodging, Brightness, Computer science, 0211 other engineering and technologies, ComputingMethodologies_IMAGEPROCESSINGANDCOMPUTERVISION, 02 engineering and technology, lcsh:Chemical technology, Biochemistry, Article, Analytical Chemistry, 0202 electrical engineering, electronic engineering, information engineering, lcsh:TP1-1185, Computer vision, optimal seam line, Electrical and Electronic Engineering, Instrumentation, 021101 geological & geomatics engineering, seam elimination, business.industry, Superresolution, Atomic and Molecular Physics, and Optics, super-resolution reconstruction, large-scale image, overlapping region, 020201 artificial intelligence & image processing, Artificial intelligence, business, Algorithm
وصف الملف: application/pdf