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المؤلفون: M. Moulin, M. Rack, T. Fache, Z. Chalupa, C. Plantier, Y. Morand, J. Lacord, F. Allibert, F. Gaillard, J. Lugo, L. Hutin, J.P. Raskin
المساهمون: UCL - SST/ICTM/ELEN - Pôle en ingénierie électrique
المصدر: Solid-State Electronics, Vol. 194, p. 108301 (2022)
مصطلحات موضوعية: Materials Chemistry, Electronic, Optical and Magnetic Materials, Electrical and Electronic Engineering, Condensed Matter Physics, Electronic, Optical and Magnetic Materials
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0f20452394e65ae338243c621f85c2c0
https://hdl.handle.net/2078.1/269243 -
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المؤلفون: J. Kanyandekwe, D. Barge, P. Morin, L. Grenouillet, M. Labrot, S. Maitrejean, E. Augendre, V. Lapras, Y. Morand, D. Dutartre, M. Gros-Jean, O. Gourhant, C. Gaumer, N. Rambal, D. Cooper, L. Clement
المصدر: Extended Abstracts of the 2018 International Conference on Solid State Devices and Materials.
مصطلحات موضوعية: Planar, Materials science, CMOS, business.industry, Optoelectronics, Epitaxy, business, PMOS logic
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::0d11f975f51d0660963a7b263064dacb
https://doi.org/10.7567/ssdm.2018.c-3-03 -
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المؤلفون: T. Francois, J. Coignus, L. Grenouillet, M. Barlas, B. Bessif, N. Vaxelaire, H. Boutry, M. Coig, E. Vilain, N. Rambal, Y. Morand, J.M. Pedini, F. Mazen, E. Nowak, F. Gaillard
المصدر: Extended Abstracts of the 2018 International Conference on Solid State Devices and Materials.
مصطلحات موضوعية: Materials science, business.industry, Optoelectronics, business, Cycling, Ferroelectricity
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::de0de8d48c59e6ec24f5ebf5a8701ec8
https://doi.org/10.7567/ssdm.2018.c-6-02 -
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المؤلفون: Pierre Morin, E. Augendre, C. Le Royer, Joel Kanyandekwe, N. Bernier, Y. Morand, B. Lherron, L. Grenouillet, Oliver Faynot, J. M. Hartmann, M. Celik, James Chingwei Li, Sylvain Maitrejean, B. De Salvo, F. Chafik, Nicolas Loubet, Hong He, R. Wacquez, S. Reboh, Aomar Halimaoui, Bruce B. Doris, Qing Liu, S. Pilorget, A. Bonnevialle
المصدر: ECS Journal of Solid State Science and Technology. 4:P376-P381
مصطلحات موضوعية: Materials science, law, Material analysis, Analytical chemistry, Crystallization, Electronic, Optical and Magnetic Materials, law.invention
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المؤلفون: D. Barge, Thibaud Denneulin, C. Le Royer, David Cooper, Jean-Paul Barnes, P. Nguyen, O. Bonnin, J. M. Pedini, Olivier Gourhant, E. Baylac, Walter Schwarzenbach, Yves Campidelli, F. Glowacki, Y. Morand, Jean-Michel Hartmann, Denis Rouchon
المصدر: Solid-State Electronics. 97:82-87
مصطلحات موضوعية: Fabrication, Materials science, business.industry, Silicon on insulator, Insulator (electricity), Condensed Matter Physics, Dark field microscopy, Electronic, Optical and Magnetic Materials, symbols.namesake, Scanning transmission electron microscopy, Materials Chemistry, Electronic engineering, symbols, Optoelectronics, Wafer, Field-effect transistor, Electrical and Electronic Engineering, business, Raman spectroscopy
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المؤلفون: A. Roule, Nicolas Bernier, Maud Vinet, C. Plantier, J. M. Pedini, C. Le Royer, L. Grenouillet, Y. Morand, A. Bonnevialle, D. Marseilhan, Claude Tabone, D. Rouchon, Pascal Besson, S. Reboh
المصدر: Extended Abstracts of the 2015 International Conference on Solid State Devices and Materials.
مصطلحات موضوعية: Materials science, Creep, Strain (chemistry), Silicon on insulator, Wafer, Tensile strain, Composite material
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::89e933226aaffad25a5bab6720dc2bf5
https://doi.org/10.7567/ssdm.2015.n-2-3 -
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المؤلفون: Alexis Farcy, B. Guigues, Joaquim Torres, Y. Morand, Emmanuel Defay, T. Bertaud, Serge Blonkowski, Bernard Flechet, T.T. Vo, Cedric Bermond, Thierry Lacrevaz
المصدر: IET Microwaves, Antennas & Propagation. 2:781-788
مصطلحات موضوعية: Permittivity, Materials science, business.industry, Copper interconnect, Electrical engineering, Dielectric, Integrated circuit, Microstrip, law.invention, Back end of line, Capacitor, law, Optoelectronics, Electrical and Electronic Engineering, business, High-κ dielectric
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8Gate-last integration on planar FDSOI MOSFET: Impact of mechanical boosters and channel orientations
المؤلفون: L. Brevard, C. Le Royer, C. Euvrard, F. Ponthenier, A. Seignard, O. Faynot, R. Gassilloud, David K. C. Cooper, Y. Morand, J.M. Hartmann, L. Tosti, S. Morvan, Claude Tabone, Thierry Poiroux, Maurice Rivoire, Pascal Besson, C. Leroux, F. Allain, B. Saidi, P. Perreau, X. Garros, M. Casse, Francois Andrieu, P. Caubet
المصدر: 2013 IEEE International Electron Devices Meeting.
مصطلحات موضوعية: Electron mobility, Materials science, Silicon, business.industry, Transistor, Silicon on insulator, chemistry.chemical_element, Equivalent oxide thickness, PMOS logic, law.invention, chemistry, law, Gate oxide, MOSFET, Electronic engineering, Optoelectronics, business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::e8a0872e8e5d7f07e6b2274643921aef
https://doi.org/10.1109/iedm.2013.6724668 -
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المؤلفون: G. Tartavel, J. Torres, Lucile Arnaud, C. Gounelle, Y. Gobil, R. Gonella, Y. Morand
المصدر: Microelectronics Reliability. 38:1029-1034
مصطلحات موضوعية: Materials science, Orders of magnitude (temperature), Metallurgy, Copper interconnect, chemistry.chemical_element, Activation energy, Condensed Matter Physics, Electromigration, Copper, Atomic and Molecular Physics, and Optics, Grain size, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Barrier layer, chemistry, Electrical and Electronic Engineering, Composite material, Safety, Risk, Reliability and Quality, Tin
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المؤلفون: P. Berruyer, R. Blanc, Y. Morand, F. Vinet, H. Feldis, T. Poiroux, M. Lerme
المصدر: Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 16:1604-1608
مصطلحات موضوعية: Materials science, Plasma etching, business.industry, fungi, Contact resistance, technology, industry, and agriculture, Analytical chemistry, macromolecular substances, Surfaces and Interfaces, Photoresist, Condensed Matter Physics, Isotropic etching, Surfaces, Coatings and Films, Etching (microfabrication), Optoelectronics, Wafer, Dry etching, Reactive-ion etching, business