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المؤلفون: Fu-Cheng Wang, Y.K. Peng
المصدر: 2018 SICE International Symposium on Control Systems (SICE ISCS).
مصطلحات موضوعية: Model predictive control, Automatic controller, Computer science, Control theory, Robustness (computer science), Transient analysis, Piezoelectricity
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::d47e002364003807e6dd313a6b574ba2
https://doi.org/10.23919/siceiscs.2018.8330157 -
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المؤلفون: R.C.J. Wang, K.Y.Y. Doong, K.L. Young, C.C. Chiu, K. Wu, S.C. Lin, L.J. Hung, Y.K. Peng, D. Su
المصدر: 2003 IEEE International Reliability Physics Symposium Proceedings, 2003. 41st Annual..
مصطلحات موضوعية: Dependency (UML), Materials science, Geometry, Stress induced voiding, Reliability (statistics), Characterization (materials science)
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::51a89976a14f2611578a05bee8acbff2
https://doi.org/10.1109/relphy.2003.1197737 -
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المؤلفون: D.H. Chen, C.T. Yang, C.C. Chiu, Y.Y. Doong, R.C.J. Wang, D.S. Su, Y.K. Peng, J.R. Shih, J.T. Yue, S.Y. Lee
المصدر: 7th International Symposium on Plasma- and Process-Induced Damage.
مصطلحات موضوعية: Materials science, business.industry, Analytical chemistry, Copper interconnect, chemistry.chemical_element, Antenna effect, Plasma, Dielectric, Copper, Electromigration, Threshold voltage, chemistry, Deposition (phase transition), Optoelectronics, business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::d363431158e1dfd4de92f7c6db40ba98
https://doi.org/10.1109/ppid.2002.1042635 -
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المؤلفون: J.R. Shih, Y.K. Peng, J.T. Yue, T.C. Ong, K.C. Liu, Jian-Hsing Lee, Y.H. Wu, R.Y. Shiue, C.S. Tang
المصدر: 2002 IEEE International Reliability Physics Symposium. Proceedings. 40th Annual (Cat. No.02CH37320).
مصطلحات موضوعية: LDMOS, Engineering, Electrostatic discharge, business.industry, Direct current, Electrical engineering, Thyristor, Integrated circuit, law.invention, law, Power semiconductor device, Power MOSFET, business, Voltage
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::642afdfc47dc3d47b779e029359da410
https://doi.org/10.1109/relphy.2002.996629 -
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المصدر: 7th International Symposium on Plasma- and Process-Induced Damage.
مصطلحات موضوعية: Temperature gradient, Thermal conductivity, Materials science, Condensed matter physics, Depletion region, Gate oxide, Thermoelectric effect, Analytical chemistry, Breakdown voltage, Time-dependent gate oxide breakdown, Thermal conduction
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::4ce33a1bab2d780f5f7022edccca7c41
https://doi.org/10.1109/ppid.2002.1042609 -
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المؤلفون: J.T. Yue, Y.K. Peng, J.B. Lai, L.H. Chu, Shun-Yi Lee, R.Y. Shiue, Y.S. Huang, S.C. Lee
المصدر: 2001 IEEE International Reliability Physics Symposium Proceedings. 39th Annual (Cat. No.00CH37167).
مصطلحات موضوعية: Production line, Work (thermodynamics), Materials science, Skew, Process control, Mechanics, Test method, Failure mode and effects analysis, Electromigration, Isothermal process, Reliability engineering
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::c2f51c085390120a06b0031be12fb242
https://doi.org/10.1109/relphy.2001.922899 -
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المؤلفون: L.H. Chu, R.Y. Shiue, F.S. Lin, W.L. Sung, C.C. Hsieh, K.F. Yu, M.J. Chen, J.T. Yue, Y.K. Peng, J.R. Shih
المصدر: 2001 6th International Symposium on Plasma- and Process-Induced Damage (IEEE Cat. No.01TH8538).
مصطلحات موضوعية: Back end of line, Materials science, Passivation, Gate oxide, business.industry, MOSFET, Dangling bond, Electrical engineering, Optoelectronics, Carrier lifetime, Dielectric, business, Leakage (electronics)
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::3375f085adb5ef05a582876f60a77a45
https://doi.org/10.1109/ppid.2001.929967 -
8دورية أكاديمية
لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل. -
9
المؤلفون: Y.K. Peng, S.Q.A.M.A. Hossain, D.A. Rankin
المصدر: Electronics Letters. 31:256-257
مصطلحات موضوعية: Statistics::Theory, Range (mathematics), ComputingMethodologies_PATTERNRECOGNITION, Mathematics::Probability, Artificial neural network, Computer science, Speech recognition, Computer Science::Neural and Evolutionary Computation, Speech coding, Electrical and Electronic Engineering, Linear predictive coding, Speech processing, GeneralLiterature_REFERENCE(e.g.,dictionaries,encyclopedias,glossaries)
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::25963d17fc16c1f876c4064755a85ac7
https://doi.org/10.1049/el:19950173 -
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المؤلفون: Y.K. Peng, P.T. Dawson
المصدر: Surface Science. 92:1-13
مصطلحات موضوعية: Materials science, Adsorption desorption, chemistry, Hydrogen, Inorganic chemistry, Materials Chemistry, chemistry.chemical_element, Surfaces and Interfaces, Condensed Matter Physics, Platinum, Oxygen, Surfaces, Coatings and Films