المؤلفون: García, M. A., Vinolas, J., Garcia Alonso, M. S., Hernando, A.

المصدر: Journal of Applied Physics; 6/28/2024, Vol. 135 Issue 24, p1-8, 8p

مصطلحات موضوعية: STRAINS & stresses (Mechanics), ELECTROMAGNETIC induction, YIELD strength (Engineering), ELECTROMAGNETIC measurements, STEEL

المؤلفون: Kailin, Z., Qiang, G., Longtao, J., Luyang, H., Jiajun, Z., Hengchao, L., Liu, X., Feng, Y., Jian Feng, L., Pingxiang, Z.

المصدر: IEEE Transactions on Applied Superconductivity IEEE Trans. Appl. Supercond. Applied Superconductivity, IEEE Transactions on. 34(3):1-5 May, 2024

المؤلفون: Weatherspoon, Howard, Peters, Baron

المصدر: Journal of Chemical Physics; 4/28/2024, Vol. 160 Issue 16, p1-9, 9p

مصطلحات موضوعية: ORGANIC synthesis, YIELD strength (Engineering), NUCLEATION

المؤلفون: Wang, B., Prakash, V.

المصدر: Journal of Applied Physics; 2/7/2024, Vol. 135 Issue 5, p1-14, 14p

مصطلحات موضوعية: TUNGSTEN carbide, SHOCK waves, YIELD strength (Engineering), IMPEDANCE matching, COBALT

المؤلفون: Specht, Paul E., Ruggles, Timothy, Miers, John, Moore, David, Brown, Nathan, Duwal, Sakun, Branch, Brittany

المصدر: Journal of Applied Physics; 2/7/2024, Vol. 135 Issue 5, p1-14, 14p

مصطلحات موضوعية: ENTHALPY, BODY centered cubic structure, CRYSTAL defects, YIELD strength (Engineering), SCANNING electron microscopy

المؤلفون: Syzrantsev, V. V.^{Aff1, IDs10891024029690_cor1}, Gatsaev, Z. Sh., Viskhanov, S. S.

المصدر: Journal of Engineering Physics and Thermophysics. 97(4):993-1000

المؤلفون: Li, Jun-Zhi, Bao, Wei-Zong, Chen, Jie, Yu, Bo-Hua, Zuo, Kun, Gao, Tian, Cai, Ze-Yun, Xie, Guo-Qiang^{Aff1, Aff2, IDs12598024026571_cor8}

المصدر: Rare Metals. 43(7):3314-3328

المؤلفون: Anantha, Muni Tanuja^{Aff1, Aff2, IDs12008023015548_cor1}, Buddi, Tanya, Boggarapu, Nageswara Rao

المصدر: International Journal on Interactive Design and Manufacturing (IJIDeM). 18(5):3333-3343

المؤلفون: Savitha, U., Nayan, Niraj^{Aff2, IDs11668024019702_cor2}, Karthikeyan, M. K., Shivaram, B. R. N. V., Prakash, Gino, Reddy, Ram, Naik, Rathiram, Singh, Satish Kumar

المصدر: Journal of Failure Analysis and Prevention. :1-11

المؤلفون: Galiev, F. F.^{Aff1, IDS2075113324700205_cor1}, Saikov, I. V.^{Aff1, IDS2075113324700205_cor2}, Berbentsev, V. D.^{Aff2, IDS2075113324700205_cor3}, Sytschev, A. E.^{Aff1, IDS2075113324700205_cor4}, Nigmatullina, G. R.^{Aff1, IDS2075113324700205_cor5}, Alymov, M. I.^{Aff1, IDS2075113324700205_cor6}

المصدر: Inorganic Materials: Applied Research. 15(3):772-778