-
1
المؤلفون: Yao-Wen Chang, Guan-Wei Wu, I-Chen Yang, Yu-Hung Huang, Ya-Jui Lee, Chih-Hsiung Lee, Kuan-Fu Chen, Tao-Cheng Lu, Kuang-Chao Chen, Chih-Yuan Lu
المصدر: IEEE Electron Device Letters. 43:2077-2080
-
2
المؤلفون: Ya-Jui Lee, Chin-Rung Yan, Yu-Jie Liao, Yin-Chia Lin, Jone F. Chen, Huei-Haurng Chen, Chung-Yi Lin, Chih-Yuan Chen
المصدر: IEEE Transactions on Electron Devices. 60:992-997
مصطلحات موضوعية: Materials science, business.industry, Interface (computing), Transistor, NAND gate, Corner effect, Electronic, Optical and Magnetic Materials, law.invention, Flash (photography), law, Nat, Charge trap flash, Electronic engineering, Optoelectronics, Extraction methods, Electrical and Electronic Engineering, business
-
3
المؤلفون: Chrong Jung Lin, H. Arakawa, Ya-Jui Lee, Chieh-Yi Lu, Te-Yuan Yin, Zih-Song Wang, Tzung-Hua Ying
المصدر: IEEE Transactions on Electron Devices. 60:254-259
مصطلحات موضوعية: Materials science, Passivation, business.industry, NAND gate, Electronic, Optical and Magnetic Materials, Reliability (semiconductor), Flash (manufacturing), Electronic engineering, Degradation (geology), Deposition (phase transition), Optoelectronics, Electrical and Electronic Engineering, Diffusion (business), business, Layer (electronics)
-
4
المؤلفون: Ying-Chia Li, Rex Yang, Chrong Jung Lin, Huei-Haurng Chen, Zih-Song Wang, Ya-Jui Lee
المصدر: IEEE Electron Device Letters. 33:896-898
مصطلحات موضوعية: Materials science, genetic structures, business.industry, Nand flash memory, NAND gate, Cell design, Electronic, Optical and Magnetic Materials, Interference (communication), Flash (manufacturing), Shallow trench isolation, Charge trap flash, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, Optoelectronics, Electrical and Electronic Engineering, business, Communication channel
-
5دورية أكاديمية
المؤلفون: Zih-Song Wang, Ya-Jui Lee, Yang, Rex, Ying-Chia Li, Huei-Haurng Chen, Chrong Jung Lin
المصدر: IEEE Electron Device Letters; Jun2012, Vol. 33 Issue 6, p896-898, 3p
مصطلحات موضوعية: FLASH memory, FLUCTUATIONS (Physics), SELF-alignment (Materials science), COMPUTER interfaces