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1دورية أكاديمية
المؤلفون: Fei Chen, Bo Chen, Hongzhe Lin, Yachen Kong, Xin Liu, Xuepeng Zhan, Jiezhi Chen
المصدر: Micromachines, Vol 12, Iss 10, p 1152 (2021)
مصطلحات موضوعية: 3D NAND flash memory, temperature, endurance, read disturb, Mechanical engineering and machinery, TJ1-1570
وصف الملف: electronic resource
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2
المؤلفون: Menghua Jia, Yachen Kong, Xuepeng Zhan, Meng Zhang, Fei Wu, Jiezhi Chen
المصدر: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 41:4797-4807
مصطلحات موضوعية: Electrical and Electronic Engineering, Computer Graphics and Computer-Aided Design, Software
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3
المؤلفون: Hongzhe Lin, Yifan Guo, Yifang Xi, Yachen Kong, Xuepeng Zhan, Jiezhi Chen
المصدر: 2022 IEEE Silicon Nanoelectronics Workshop (SNW).
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::a9fafe3d4bd70c3027c608fd55698e04
https://doi.org/10.1109/snw56633.2022.9889070 -
4
المؤلفون: Binglu Chen, Yachen Kong, Zhaohui Sun, Xiaotong Fang, Xuepeng Zhan, Jiezhi Chen
المصدر: 2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM).
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::97bb93deb33aec978631a94c21db2ef2
https://doi.org/10.1109/edtm53872.2022.9798237 -
5
المؤلفون: Rui Cao, Xuepeng Zhan, Jiezhi Chen, Yachen Kong, Meng Zhang
المصدر: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 39:4042-4051
مصطلحات موضوعية: Hardware_MEMORYSTRUCTURES, business.industry, Computer science, Nand flash memory, NAND gate, Charge (physics), 02 engineering and technology, Computer Graphics and Computer-Aided Design, 020202 computer hardware & architecture, Trap (computing), Reliability (semiconductor), Computer data storage, 0202 electrical engineering, electronic engineering, information engineering, Electrical and Electronic Engineering, business, Software, Computer hardware
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6
المؤلفون: Yifang Xi, Xiaotong Fang, Yachen Kong, Yifan Guo, Hongzhe Lin, Xuepeng Zhan, Jiezhi Chen
المصدر: 2021 IEEE International Conference on Integrated Circuits, Technologies and Applications (ICTA).
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::de123ca580734142e384951c59add0b3
https://doi.org/10.1109/icta53157.2021.9661687 -
7
المؤلفون: Yuan Li, Jiezhi Chen, Xuepeng Zhan, Yachen Kong, Xiaotong Fang, Yifan Guo, Menghua Jia
المصدر: 2021 5th IEEE Electron Devices Technology & Manufacturing Conference (EDTM).
مصطلحات موضوعية: 010302 applied physics, Physics, Hardware_MEMORYSTRUCTURES, Nand flash memory, NAND gate, Charge (physics), 02 engineering and technology, Trapping, 021001 nanoscience & nanotechnology, 01 natural sciences, Threshold voltage, Reliability (semiconductor), 0103 physical sciences, Electronic engineering, 0210 nano-technology, Error detection and correction, Degradation (telecommunications)
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::9548c60f94ebf984b225d63382c90ec5
https://doi.org/10.1109/edtm50988.2021.9420961 -
8
المؤلفون: Xuepeng Zhan, Yachen Kong, Fei Wang, Jiezhi Chen, Menghua Jia, Yuan Li, Xueyang Peng
المصدر: 2020 IEEE 15th International Conference on Solid-State & Integrated Circuit Technology (ICSICT).
مصطلحات موضوعية: Physics, Trap (computing), Nand flash memory, business.industry, Electric field, Energy level, Optoelectronics, Charge (physics), Data retention, business, Flash memory, Threshold voltage
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::98019df281e6db84513df0a539736c2a
https://doi.org/10.1109/icsict49897.2020.9278015 -
9
المؤلفون: Jiezhi Chen, Yuan Li, Menghua Jia, Fei Wang, Xueyang Peng, Xuepeng Zhan, Yachen Kong
المصدر: 2020 IEEE 15th International Conference on Solid-State & Integrated Circuit Technology (ICSICT).
مصطلحات موضوعية: Trap (computing), Physics, Flash (photography), Hardware_MEMORYSTRUCTURES, Reliability (semiconductor), Encoding (memory), NAND gate, Chip, Quantum tunnelling, Data modeling, Computational science
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::a4903a02a479cd584850d49be23aa8f4
https://doi.org/10.1109/icsict49897.2020.9278186 -
10
المؤلفون: Yachen Kong, Bo Chen, Xin Liu, Hongzhe Lin, Xuepeng Zhan, Fei Chen, Jiezhi Chen
المصدر: Micromachines
Volume 12
Issue 10
Micromachines, Vol 12, Iss 1152, p 1152 (2021)مصطلحات موضوعية: endurance, Hardware_MEMORYSTRUCTURES, Materials science, 3D NAND flash memory, Nand flash memory, business.industry, Mechanical Engineering, Reading (computer), temperature, NAND gate, Atmospheric temperature range, Article, Trap (computing), Flash (photography), Reliability (semiconductor), Control and Systems Engineering, TJ1-1570, Degradation (geology), Optoelectronics, Mechanical engineering and machinery, read disturb, Electrical and Electronic Engineering, business
وصف الملف: application/pdf