يعرض 1 - 7 نتائج من 7 نتيجة بحث عن '"Yanagawa, Douglas"', وقت الاستعلام: 1.41s تنقيح النتائج
  1. 1
    مؤتمر
    Resistance Modeling for Striplines with Different Surface Roughness on the Planes

    المؤلفون: Yong, Shaohui, Khilkevich, Victor, Liu, Yuanzhuo, He, Jiayi, Gao, Han, Hinaga, Scott, Padilla, Darja, Yanagawa, Douglas, Fan, Jun, Drewniak, James

    المصدر: 2020 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI) Electromagnetic Compatibility & Signal/Power Integrity (EMCSI), 2020 IEEE International Symposium on. :340-345 Jul, 2020

    Relation: 2020 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI)

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  2. 2
    مؤتمر
    A Cross-sectional Profile Based Model for Stripline Conductor Surface Roughness

    المؤلفون: Yong, Shaohui, Khilkevich, Victor, Liu, Yuanzhuo, He, Ruijie, Guo, Yuandong, Gao, Han, Hinaga, Scott, Padilla, Darja, Yanagawa, Douglas, Fan, Jun, Drewniak, James

    المصدر: 2020 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI) Electromagnetic Compatibility & Signal/Power Integrity (EMCSI), 2020 IEEE International Symposium on. :334-339 Jul, 2020

    Relation: 2020 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI)

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  3. 3
    مؤتمر
    Dielectric Material and Foil Surface Roughness Properties Extraction Based on Single-ended Measurements and Phase Constant ($\beta$) Fitting

    المؤلفون: Yong, Shaohui, Khilkevich, Victor, Penugonda, Srinath, Cai, Xiao-Ding, Gao, Qian, Sen, Bidyut, Gao, Han, Yanagawa, Douglas, Padilla, Darja, Hinaga, Scott, Drewniak, James, Fan, Jun

    المصدر: 2020 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI) Electromagnetic Compatibility & Signal/Power Integrity (EMCSI), 2020 IEEE International Symposium on. :346-351 Jul, 2020

    Relation: 2020 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI)

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  4. 4
    مؤتمر
    A Practical De-embedding Error Analysis Method Based on Statistical Circuit Models of Fixtures

    المؤلفون: Yong, Shaohui, Liu, Yuanzhuo, Gao, Han, Hinaga, Scott, De, Soumya, Padilla, Darja, Yanagawa, Douglas, Drewniak, James, Khilkevich, Victor

    المصدر: 2019 IEEE International Symposium on Electromagnetic Compatibility, Signal & Power Integrity (EMC+SIPI) Electromagnetic Compatibility, Signal & Power Integrity (EMC+SIPI), 2019 IEEE International Symposium on. :45-50 Jul, 2019

    Relation: 2019 IEEE International Symposium on Electromagnetic Compatibility, Signal & Power Integrity (EMC+SIPI)

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  5. 5
    مؤتمر
    Design methodology for behavioral surface roughness model

    المؤلفون: Guo, Xinyao, Gao, Han, Shen, Guangyao, Liu, Qian, Khilkevich, Victor, Drewniak, James, De, Soumya, Hinaga, Scott, Yanagawa, Douglas

    المصدر: 2016 IEEE International Symposium on Electromagnetic Compatibility (EMC) Electromagnetic Compatibility (EMC), 2016 IEEE International Symposium on. :927-931 Jul, 2016

    Relation: 2016 IEEE International Symposium on Electromagnetic Compatibility - EMC 2016

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  6. 6
    دورية أكاديمية

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  7. 7
    دورية أكاديمية

    لا يتم عرض هذه النتيجة على الضيوف.

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