المؤلفون: Takata, H., Yanase, M., Waki, T., Hachino, T.

المصدر: Proceedings of the 41st SICE Annual Conference. SICE 2002. SICE 2002 SICE 2002. Proceedings of the 41st SICE Annual Conference. 4:2424-2429 vol.4 2002

Relation: SICE 2002. Proceedings of the 41st SICE Annual Conference

المؤلفون: Murakami, Y., Nagai, H., Kikuchi, T., Yamamura, A., Idegami, K., Yanase, M., Yong-Sung Choi, Morita, Y., Tamiya, E.

المصدر: 1st Annual International IEEE-EMBS Special Topic Conference on Microtechnologies in Medicine and Biology. Proceedings (Cat. No.00EX451) Microtechnologies in medicine and biology Microtechnologies in Medicine and Biology, 1st Annual International, Conference On. 2000. :29-32 2000

Relation: 1st Annual International IEEE-EMBS Special Topic Conference on Microtechnologies in Medicine and Biology. Proceedings

المؤلفون: Murao, K., Kohda, T., Okayama, S., Yanase, M.

المصدر: 1992 IEEE International Symposium on Circuits and Systems (ISCAS) Circuits and Systems (ISCAS), 1992 IEEE International Symposium on. 6:2793-2796 vol.6 1992

Relation: 1992 IEEE International Symposium on Circuits and Systems (ISCAS)

المؤلفون: Murao, K., Kohda, T., Noda, K., Yanase, M.

المصدر: IEEE Transactions on Circuits and Systems I: Fundamental Theory and Applications IEEE Trans. Circuits Syst. I Circuits and Systems I: Fundamental Theory and Applications, IEEE Transactions on. 39(10):851-853 Oct, 1992

المؤلفون: Yamada, Y., Yanase, M., Miura, D., Chikuba, K.

المصدر: In Microelectronics Reliability September 2016 64:484-488

المؤلفون: Yanase, M., Hasegawa, M., Ikeguchi, T., Matozaki, T.

المصدر: Proceedings of 18th Annual International Conference of the IEEE Engineering in Medicine and Biology Society Engineering in medicine and biology Engineering in Medicine and Biology Society, 1996. Bridging Disciplines for Biomedicine. Proceedings of the 18th Annual International Conference of the IEEE. 2:734-735 vol.2 1996

Relation: Proceedings of 18th Annual International Conference of the IEEE Engineering in Medicine and Biology Society

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المؤلفون: Ishizaki, T., Yanase, M., Kuno, A., Satoh, T., Usui, M., Osawa, F., Yamada, Y.

المصدر: In Microelectronics Reliability June 2015 55(7):1060-1066