المؤلفون: Sang, L.N., Li, Z., Yang, G.S., Yue, Z.J., Liu, J.X., Cai, C.B., Wu, T., Dou, S.X., Ma, Y.W., Wang, X.L.

المصدر: In Materials Today Physics July 2021 19

المؤلفون: Lin, M.H., Lin, Y.L., Yang, G.S., Yeh, M.-S., Chang, K.P., Su, K.C., Tahui Wang

المصدر: Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004 (IEEE Cat. No.04TH8743) Physical and failure analysis of integrated circuits Physical and Failure Analysis of Integrated Circuits, 2004. IPFA 2004. Proceedings of the 11th International Symposium on the. :177-180 2004

Relation: Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004

المؤلفون: Chen, M.C., Tsai, C.W., Gu, S.H., Tahui Wang, Lu, S.H., Lin, S.W., Yang, G.S., Chen, J.K., Chien, S.C., Loh, Y.T., Liu, F.T.

المصدر: 2002 IEEE International Reliability Physics Symposium. Proceedings. 40th Annual (Cat. No.02CH37320) Reliability physics symposium Reliability Physics Symposium Proceedings, 2002. 40th Annual. :404-408 2002

Relation: 2002 IEEE International Reliability Physics Symposium Proceedings. 40th Annual

المؤلفون: Lin, M.H., Yang, G.S., Lin, Y.L., Lin, M.T., Lin, C.C., Yeh, M.S., Chang, K.P., Su, K.C., Chen, J.K., Chang, Y.J., Tahui Wang

المصدر: IEEE International Integrated Reliability Workshop Final Report, 2002. Integrated reliability Integrated Reliability Workshop Final Report, 2002. IEEE International. :50-54 2002

Relation: IEEE International Integrated Reliability Workshop

المؤلفون: Shih, H.H., Tsai, C.Y., Yang, G.S., Chen, K.C., Yew, T.R., Lur, W., Liou, F.T.

المصدر: 1999 4th International Symposium on Plasma Process-Induced Damage (IEEE Cat. No.99TH8395) Plasma process-induced damage Plasma Process-Induced Damage, 1999 4th International Symposium on. :88-91 1999

Relation: 1999 4th International Symposium on Plasma Process-Induced Damage

المؤلفون: Yang, G.S., Aslam, D.M.

المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 17(5):250-252 May, 1996

المؤلفون: Zhang, Q., Ji, X.W., Hou, X.M., Lu, F.M., Du, Y., Yin, J.H., Sun, X.Y., Deng, Y., Zhao, J., Han, X., Yang, G.S., Zhang, H.W., Chen, X.M., Shen, H.B., Wang, H.Y., Cao, G.W. ^*

المصدر: In Annals of Oncology December 2014 25(12):2413-2419

المؤلفون: Shawyer, B.L.R., Yang, G.S.

المصدر: Shawyer, B.L.R.; Yang, G.S.: Manuscripta Mathematica. 5 1971

وصف الملف: image/jpeg; application/pdf

URL الوصول: http://resolver.sub.uni-goettingen.de/purl?GDZPPN00221640X

المؤلفون: Wu, Z.F., Zhang, H.B., Yang, N., Zhao, W.C., Fu, Y., Yang, G.S.

المصدر: In European Journal of Surgical Oncology July 2012 38(7):602-610

المؤلفون: Fan, Z.X., Lei, W.X., Sun, X.L., Yu, B., Wang, Y.Z., Yang, G.S.

المصدر: Journal of Plant Pathology, 2008 Mar 01. 90(1), 43-48.

URL الوصول: https://www.jstor.org/stable/41998457