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المؤلفون: D. K. Sohn, Y.K. Bae, Y.D. Lim, Yohan Kim, J.G. Hong, C. Ryou, Soon-yeon Park, C.G. Koh, Jae Gon Lee, Jung-Chak Ahn, S. Hyun, Byung-chan Lee, Sangjoo Lee, Yang-Soo Son, D.H. Cha, C.L. Cheng, Sung-dae Suk, S.W. Nam, H.-J. Cho, J.S. Yoon, Won-Jun Jang, M. Sadaaki, Ming Li, S.H. Hong, Wouns Yang, Sang-pil Sim, Dong-Won Kim, S. Choi, Jung-In Hong, Won-Cheol Jeong, B. U. Yoon, Hwa-Sung Rhee, Min-Sang Kim, Chilhee Chung, Daphnee Hui Lin Lee, Sang-Bom Kang, Kang-ill Seo, Hee-Soo Kang
المصدر: 2011 International Electron Devices Meeting.
مصطلحات موضوعية: Planar, Materials science, Strain engineering, CMOS, business.industry, Low-power electronics, Electrical engineering, Optoelectronics, Short-channel effect, Static random-access memory, business, High-κ dielectric, Power (physics)
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::54cdf33871f7ca3ae9bad66959de4b4c
https://doi.org/10.1109/iedm.2011.6131556 -
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المؤلفون: Jong-Hyuk Kim, Soon-Moon Jung, Young-Seop Rah, Wonseok Cho, Kinam Kim, Jae-Hun Jeong, Kyoung-Hon Kim, Hoosung Cho, Yang-Soo Son, Jun-Beom Park, Jae-Hoon Jang, Min-Sung Song, Young-Chul Chang, Jin-Soo Lim
المصدر: 2006 International Electron Devices Meeting.
مصطلحات موضوعية: Hardware_MEMORYSTRUCTURES, Materials science, Silicon, business.industry, Stacking, NAND gate, chemistry.chemical_element, 32-bit, chemistry, Charge trap flash, Electronic engineering, Optoelectronics, Node (circuits), Static random-access memory, business, Single crystal
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::d84ae67d7d3efdc0dfab1b0c8774a7a5
https://doi.org/10.1109/iedm.2006.346902 -
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المؤلفون: Sunae Seo, Hyung-Guel Kim, Kun-Ho Kwak, Duk-ha Park, B.J. Hwang, Yang-Soo Son, K.N. Kim, Kyoung-Min Koh, J.H. Jang, J.Y. Lee
المصدر: 2003 International Symposium on VLSI Technology, Systems and Applications. Proceedings of Technical Papers. (IEEE Cat. No.03TH8672).
مصطلحات موضوعية: Hardware_MEMORYSTRUCTURES, Materials science, business.industry, Subthreshold conduction, Transistor, Electrical engineering, Hardware_PERFORMANCEANDRELIABILITY, PMOS logic, law.invention, Process variation, law, MOSFET, Hardware_INTEGRATEDCIRCUITS, Optoelectronics, Static random-access memory, business, NMOS logic, Hardware_LOGICDESIGN, Leakage (electronics)
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::e7d80f29d54e6f8c3aec6f18ea1c41a7
https://doi.org/10.1109/vtsa.2003.1252553 -
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المؤلفون: Kinam Kim, J.H. Jang, Hyung-Guel Kim, Kyoung-Min Koh, D. Park, Kun-Ho Kwak, Yang-Soo Son, G.H. Han, B.J. Hwang
المصدر: 2003 Symposium on VLSI Technology. Digest of Technical Papers (IEEE Cat. No.03CH37407).
مصطلحات موضوعية: Materials science, Silicon, business.industry, Electrical engineering, chemistry.chemical_element, Chip, Capacitance, Power (physics), chemistry, CMOS, Software_SOFTWAREENGINEERING, MOSFET, Hardware_INTEGRATEDCIRCUITS, Static random-access memory, business, Voltage
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::eb216fc1bb839bd3a0555cf4f0bb9987
https://doi.org/10.1109/vlsit.2003.1221089