المؤلفون: Zhu, Y.B., Liao, M.Y., Yao, R.H.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 69(8):4460-4468 Aug, 2022

المؤلفون: Zhu, Y.B., Liao, M.Y., Zhao, P., Yao, R.H.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 68(12):6538-6545 Dec, 2021

المؤلفون: Zhu, Y.B., Geng, K., Cheng, Z.S., Yao, R.H.

المصدر: IEEE Transactions on Plasma Science IEEE Trans. Plasma Sci. Plasma Science, IEEE Transactions on. 49(7):2107-2112 Jul, 2021

المؤلفون: Huang, J.B., Yao, R.H., Zhao, P., Zhu, Y.B.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 68(7):3604-3610 Jul, 2021

المؤلفون: Liao, M.Y., Yao, R.H., Zhu, Y.B.

المصدر: IEEE Journal of the Electron Devices Society IEEE J. Electron Devices Soc. Electron Devices Society, IEEE Journal of the. 9:1009-1016 2021

المؤلفون: Lu, Y., Yao, R.H., Huang, D.Q., Su, J., Jiang, J., Ki, W.-H.

المصدر: 2014 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS) Circuits and Systems (APCCAS), 2014 IEEE Asia Pacific Conference on. :105-108 Nov, 2014

Relation: 2014 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS)

المؤلفون: Fu, Z.W., Zhou, B., Yao, R.H., Liu, Y.R., Li, X.P.

المصدر: IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 17(4):773-779 Dec, 2017

المؤلفون: Yao, R.H., She, J.C., Deng, S.Z., Jun Chen, Xu, N.S.

المصدر: 2007 IEEE 20th International Vacuum Nanoelectronics Conference Vacuum Nanoelectronics Conference, 2007. IVNC. IEEE 20th International. :133-134 Jul, 2007

Relation: 2007 IEEE 20th International Vacuum Nanoelectronics Conference (IVNC)

المؤلفون: Cai, M.X., Yao, R.H.

المصدر: In Solid State Electronics March 2018 141:23-30

المؤلفون: Qin, Jian, Yao, R.H.

المصدر: In Solid State Electronics May 2014 95:46-51