المؤلفون: Shum, D.P., Swift, C.T., Higman, J.M., Taylor, W.J., Kuo-Tung Chang, Ko-Min Chang, Yeargain, J.R.

المصدر: Proceedings of 1994 IEEE International Electron Devices Meeting Electron devices Electron Devices Meeting, 1994. IEDM '94. Technical Digest., International. :41-44 1994

Relation: Proceedings of 1994 IEEE International Electron Devices Meeting

المؤلفون: Sun, S.W., Tsui, P.G.Y., Somero, B.M., Klein, J., Pintchovski, F., Yeargain, J.R., Pappert, B.

المصدر: International Electron Devices Meeting 1991 [Technical Digest] Electron Devices Meeting, 1991. IEDM '91. Technical Digest., International. :85-88 1991

Relation: 1991 International Electron Devices Meeting

المؤلفون: Tsui, P.G.Y., Pappert, B., Sun, S.W., Yeargain, J.R.

المصدر: IEEE Journal of Solid-State Circuits IEEE J. Solid-State Circuits Solid-State Circuits, IEEE Journal of. 28(3):371-374 Mar, 1993

المؤلفون: Sun, S.W., Tsui, P.G.Y., Somero, B.M., Klein, J., Pintchovski, F., Yeargain, J.R., Pappert, B., Bertram, R.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 39(12):2733-2739 Dec, 1992

المؤلفون: Tsui, P.G.Y., Shih Wei Sun, Yeargain, J.R., Pappert, B.

المصدر: 1992 Proceedings of the IEEE Custom Integrated Circuits Conference Custom Integrated Circuits Conference, 1992., Proceedings of the IEEE 1992. :9.4.1-9.4.4 1992

Relation: 1992 Proceedings of the IEEE Custom Integrated Circuits Conference

المؤلفون: Kim, Y.-S., Okada, Y., Chang, K.-M., Tobin, P.J., Morton, B., Choe, H., Bowers, M., Kuo, C., Chrudimsky, D., Ajuria, S.A., Yeargain, J.R.

المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 14(7):342-344 Jul, 1993

المؤلفون: Sharma, U., Kuo-Tung Chang, Woo, M., Ko-Min Chang, Yeargain, J.R.

المصدر: Proceedings of 1994 VLSI Technology Symposium VLSI technology VLSI Technology, 1994. Digest of Technical Papers. 1994 Symposium on. :67-68 1994

Relation: Proceedings of 1994 VLSI Technology Symposium

المؤلفون: Sharma, U., Woo, M., Kirsch, H., Hayden, J., Yeargain, J.R.

المصدر: Symposium 1993 on VLSI Technology VLSI Technology, 1993. Digest of Technical Papers. 1993 Symposium on. :53-54 1993

Relation: Symposium 1993 on VLSI Technology

المؤلفون: Sun, S.W., Fu, K.-Y., Swift, C.T., Yeargain, J.R.

المصدر: 27th Annual Proceedings., International Reliability Physics Symposium Reliability Physics Symposium, 1989. 27th Annual Proceedings., International. :183-188 1989

Relation: 27th Annual Proceedings., International Reliability Physics Symposium

المؤلفون: Yeargain, J.R., Kuo, C.

المصدر: 1981 International Electron Devices Meeting IEDM Tech. Dig. Electron Devices Meeting, 1981 International. :24-27 1981

Relation: International Electron Devices Meeting 1981