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1
المصدر: 2022 IEEE International Test Conference (ITC).
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::122f5554c4b6c04036814748a949d7bf
https://doi.org/10.1109/itc50671.2022.00089 -
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المؤلفون: Minqiang Peng, Youfa Wu, Jialiang Li, Alex Yu, Grigor Tshagharyan, Costas Argyrides, Vilas Sridharan, Gurgen Harutyunyan, Yervant Zorian, Nilanjan Mukherjee
المصدر: 2022 IEEE 40th VLSI Test Symposium (VTS).
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::204a5d475b508dda9fa4743eae32adf9
https://doi.org/10.1109/vts52500.2021.9794190 -
3
المؤلفون: Yervant Zorian, Samvel Shoukourian, G. Harutyunyan, Suren Martirosyan
المصدر: IEEE Transactions on Emerging Topics in Computing. 8:700-711
مصطلحات موضوعية: 010302 applied physics, Hierarchy, Computer science, Reliability (computer networking), Hardware_PERFORMANCEANDRELIABILITY, 02 engineering and technology, Fault (power engineering), 01 natural sciences, Fault detection and isolation, 020202 computer hardware & architecture, Computer Science Applications, Reliability engineering, Scrambling, Human-Computer Interaction, Flow (mathematics), Test algorithm, 0103 physical sciences, 0202 electrical engineering, electronic engineering, information engineering, Computer Science (miscellaneous), Field-programmable gate array, Information Systems
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::43ce2a2c256e0763b6bc206802ae3623
https://doi.org/10.1109/tetc.2018.2789818 -
4
المصدر: Microelectronics Reliability. 137:114774
مصطلحات موضوعية: Electrical and Electronic Engineering, Safety, Risk, Reliability and Quality, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials
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5
المؤلفون: Yu Huang, David Francis, Yervant Zorian, Nilanjan Mukherjee
المصدر: 2021 IEEE International Test Conference in Asia (ITC-Asia).
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::3383b190e1945401096802e170ccae1c
https://doi.org/10.1109/itc-asia53059.2021.9808808 -
6
المؤلفون: G. Harutyunyan, Samvel Shoukourian, Yervant Zorian
المصدر: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 38:562-575
مصطلحات موضوعية: Computer science, Transistor, 02 engineering and technology, Integrated circuit, Fault (power engineering), Computer Graphics and Computer-Aided Design, Column (database), 020202 computer hardware & architecture, law.invention, law, 0202 electrical engineering, electronic engineering, information engineering, Table (database), Electrical and Electronic Engineering, Variety (universal algebra), Algorithm, Software
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المؤلفون: M. Casarsa, Yervant Zorian, G. Harutyunyan
المصدر: ITC
مصطلحات موضوعية: Functional safety, Random access memory, Built-in self-test, Computer science, business.industry, Automotive industry, ComputerApplications_COMPUTERSINOTHERSYSTEMS, business, Reliability engineering, Test (assessment)
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::e9816544634f4d0c2b3bf00d2df1552e
https://doi.org/10.1109/itc44778.2020.9325275 -
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المؤلفون: Donato Luongo, Yervant Zorian, Hayk Grigoryan, G. Harutyunyan, Samvel Shoukourian, Duccio Lazzarotti, Hanna Shaheen, Gabriele Boschi
المصدر: ITC
مصطلحات موضوعية: Computer science, business.industry, 0202 electrical engineering, electronic engineering, information engineering, Automotive industry, 02 engineering and technology, Vulnerability factors, business, Reliability (statistics), Vulnerability factor, 020202 computer hardware & architecture, Reliability engineering
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::02fc415ab63571c50ee6ef95674388b9
https://doi.org/10.1109/itc44170.2019.9000158 -
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المؤلفون: Kuen-Jong Lee, Yervant Zorian, Shi-Yu Huang, Tomoo Inoue, Huawei Li
المصدر: ITC
مصطلحات موضوعية: Globalization, Economy, Paradigm shift, Political science
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::4d3a273804cfde53d39e61d91938ceed
https://doi.org/10.1109/itc44170.2019.9000177 -
10
المصدر: ITC
مصطلحات موضوعية: Engineering, business.industry, East west, Event (computing), media_common.quotation_subject, Life quality, Technological culture, Constructive, GeneralLiterature_MISCELLANEOUS, Test (assessment), Quality (business), Engineering ethics, business, media_common
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::5b45000288ccc800b7b3ff0c08980429
https://doi.org/10.1109/itc44170.2019.9000168