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1مؤتمر
المؤلفون: Lee, Seongkwan, Park, Cheolmin, Kang, Minho, Won, Jun Yeon, Ryu, HyungSun, Choi, Jaemoo, Yim, Byunghyun
المصدر: 2022 IEEE International Test Conference (ITC) ITC Test Conference (ITC), 2022 IEEE International. :563-567 Sep, 2022
Relation: 2022 IEEE International Test Conference (ITC)
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2مؤتمر
المؤلفون: Lee, Seongkwan, Kang, Minho, Park, Cheolmin, Ryu, HyungSun, Choi, Jaemoo, Yim, Byunghyun
المصدر: 2021 IEEE International Test Conference (ITC) ITC Test Conference (ITC), 2021 IEEE International. :294-298 Oct, 2021
Relation: 2021 IEEE International Test Conference (ITC)
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3مؤتمر
المؤلفون: Ahn, JungChak, Lee, Kyungho, Kim, Yitae, Jeong, Heegeun, Kim, Bumsuk, Kim, Hongki, Park, Jongeun, Jung, Taesub, Park, Wonje, Lee, Taeheon, Park, Eunkyung, Choi, Sangjun, Choi, Gyehun, Park, Haeyong, Choi, Yujung, Lee, Seungwook, Kim, Yunkyung, Jung, Y. Jay, Park, Donghyuk, Nah, Seungjoo, Oh, Youngsun, Kim, Mihye, Lee, Yooseung, Chung, Youngwoo, Hisanori, Ihara, Im, Joonhyuk, Lee, Daniel-K J, Yim, Byunghyun, Lee, GiDoo, Kown, Heesang, Choi, Sungho, Lee, Jeonsook, Jang, Dongyoung, Kim, Youngchan, Kim, Tae Chan, Hiroshige, Goto, Choi, Chi-Young, Lee, Duckhyung, Han, GabSoo
المصدر: 2014 IEEE International Solid-State Circuits Conference Digest of Technical Papers (ISSCC) Solid-State Circuits Conference Digest of Technical Papers (ISSCC), 2014 IEEE International. :124-125 Feb, 2014
Relation: 2014 IEEE International Solid- State Circuits Conference (ISSCC)