المؤلفون: Wen-Jie Qi, Nieh, R., Onishi, R., Byoung Hun Lee, Laegu Kang, Yongjoo Jeon, Gopalan, S., Lee, J.C.

المصدر: 2000 IEEE International Reliability Physics Symposium Proceedings. 38th Annual (Cat. No.00CH37059) Reliability physics Reliability Physics Symposium, 2000. Proceedings. 38th Annual 2000 IEEE International. :72-76 2000

Relation: 2000 IEEE International Reliability Physics Symposium Proceedings. 38th Annual

المؤلفون: Byoung Hun Lee, Laegu Kang, Wen-Jie Qi, Renee Nieh, Yongjoo Jeon, Katsunori Onishi, Lee, J.C.

المصدر: International Electron Devices Meeting 1999. Technical Digest (Cat. No.99CH36318) Electron devices Electron Devices Meeting, 1999. IEDM '99. Technical Digest. International. :133-136 1999

Relation: International Electron Devices Meeting 1999. Technical Digest

المؤلفون: Wen-Jie Qi, Renee Nieh, Byoung Hun Lee, Laegu Kang, Yongjoo Jeon, Onishi, K., Ngai, T., Banerjee, S., Lee, J.C.

المصدر: International Electron Devices Meeting 1999. Technical Digest (Cat. No.99CH36318) Electron devices Electron Devices Meeting, 1999. IEDM '99. Technical Digest. International. :145-148 1999

Relation: International Electron Devices Meeting 1999. Technical Digest

المؤلفون: Yongjoo Jeon, Byoung Hun Lee, Zawadzki, K., Wen-Jie Qi, Lucas, A., Nieh, R., Lee, J.C.

المصدر: International Electron Devices Meeting 1998. Technical Digest (Cat. No.98CH36217) Electron devices - IEDM 1998 Electron Devices Meeting, 1998. IEDM '98. Technical Digest., International. :797-800 1998

Relation: International Electron Devices Meeting 1998. Technical Digest

المؤلفون: Laegu Kang, Byoung Hun Lee, Wen-Jie Qi, Yongjoo Jeon, Nieh, R., Gopalan, S., Onishi, K., Lee, J.C.

المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 21(4):181-183 Apr, 2000

المؤلفون: Kang, L., Grudowski, P., Veer Dhandapani, Yongjoo Jeon, Goktepeli, S., Byoung Min, Yeap, G., Foisy, M., Anderson, S., Mendicino, M., Venkatesan, S.

المصدر: 2003 IEEE International Conference on SOI SOI conference SOI Conference, 2003. IEEE International. :37-38 2003

Relation: 2003 IEEE International SOI Conference. Proceedings

المؤلفون: Celik, M., Krishnan, S., Fuselier, M., Wei, A., Wu, D., En, B., Cave, N., Abramowitz, P., Byoung Min, Pelella, M., Ping Yeh, Burbach, G., Taylor, B., Yongjoo Jeon, Wen-Jie Qi, Ruigang Li, Conner, J., Yeap, G., Woo, M., Mendicino, M., Karlsson, O., Wristers, D.

المصدر: 2002 Symposium on VLSI Technology. Digest of Technical Papers (Cat. No.01CH37303) VLSI technology VLSI Technology, 2002. Digest of Technical Papers. 2002 Symposium on. :166-167 2002

Relation: 2002 Symposium on VLSI Technology Digest of Technical Papers

المؤلفون: Bersuker, G., Korkin, A., Yongjoo Jeon, Huff, H.R.

المصدر: 2002 IEEE International Reliability Physics Symposium. Proceedings. 40th Annual (Cat. No.02CH37320) Reliability physics symposium Reliability Physics Symposium Proceedings, 2002. 40th Annual. :417-418 2002

Relation: 2002 IEEE International Reliability Physics Symposium Proceedings. 40th Annual

المؤلفون: Onishi, K., Kang, L., Choi, R., Dharmarajan, E., Gopalan, S., Yongjoo Jeon, Chang Seok Kang, Byoung Hun Lee, Nieh, R., Lee, J.C.

المصدر: 2001 Symposium on VLSI Technology. Digest of Technical Papers (IEEE Cat. No.01 CH37184) VLSI technology VLSI Technology, 2001. Digest of Technical Papers. 2001 Symposium on. :131-132 2001

Relation: 2001 Symposium on VLSI Technology

المؤلفون: Wen-Jie Qi, Nieh, R., Byoung Hun Lee, Onishi, K., Laegu Kang, Yongjoo Jeon, Lee, J.C., Kaushik, V., Bich-Yen Neuyen, Prabhu, L., Eisenbeiser, K., Finder, J.

المصدر: 2000 Symposium on VLSI Technology. Digest of Technical Papers (Cat. No.00CH37104) VLSI technology VLSI Technology, 2000. Digest of Technical Papers. 2000 Symposium on. :40-41 2000

Relation: 2000 Symposium on VLSI Technology. Digest of Technical Papers