المؤلفون: Yongquan, Jing, Tianshu, Wu, Jin, Li, Zhijia, Zhang, Chao, Gao

المصدر: 2019 14th IEEE International Conference on Electronic Measurement & Instruments (ICEMI) Electronic Measurement & Instruments (ICEMI), 2019 14th IEEE International Conference on. :949-953 Nov, 2019

Relation: 2019 14th IEEE International Conference on Electronic Measurement & Instruments (ICEMI)