يعرض 1 - 10 نتائج من 445 نتيجة بحث عن '"Yoo, Y.-J."', وقت الاستعلام: 1.02s تنقيح النتائج
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    دورية أكاديمية

    المصدر: IEEE Transactions on Microwave Theory and Techniques IEEE Trans. Microwave Theory Techn. Microwave Theory and Techniques, IEEE Transactions on. 63(10):3254-3264 Oct, 2015

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    مؤتمر

    المصدر: 2013 9th Asian Control Conference (ASCC) Control Conference (ASCC), 2013 9th Asian. :1-6 Jun, 2013

    Relation: 2013 9th Asian Control Conference (ASCC)

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    مؤتمر

    المؤلفون: Yoo, Y. J., Koo, J. H., Won, S. C.

    المصدر: 2011 8th Asian Control Conference (ASCC) Control Conference (ASCC), 2011 8th Asian. :834-838 May, 2011

    Relation: 2011 8th Asian Control Conference (ASCC 2011)

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    مؤتمر

    المؤلفون: Yoo, Y. J, Koo, J. H, Won, S. C

    المصدر: Proceedings of SICE Annual Conference 2010 SICE Annual Conference 2010, Proceedings of. :663-667 Aug, 2010

    Relation: SICE 2010 - 49th Annual Conference of the Society of Instrument and Control Engineers of Japan

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    مؤتمر

    المؤلفون: Yoo, Y. J., Song, Y. M.

    المصدر: 2016 International Conference on Numerical Simulation of Optoelectronic Devices (NUSOD) Numerical Simulation of Optoelectronic Devices (NUSOD), 2016 International Conference on. :71-72 Jul, 2016

    Relation: 2016 International Conference on Numerical Simulation of Optoelectronic Devices (NUSOD)

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    مؤتمر

    المصدر: 2016 Conference on Lasers and Electro-Optics (CLEO) Lasers and Electro-Optics (CLEO), 2016 Conference on. :1-2 Jun, 2016

    Relation: 2016 Conference on Lasers and Electro-Optics (CLEO)

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    مؤتمر

    المؤلفون: Yoo, Y. J., Lee, J. H., Song, Y. M.

    المصدر: 2015 International Conference on Numerical Simulation of Optoelectronic Devices (NUSOD) Numerical Simulation of Optoelectronic Devices (NUSOD), 2015 International Conference on. :73-74 Sep, 2015

    Relation: 2015 International Conference on Numerical Simulation of Optoelectronic Devices (NUSOD)

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    مؤتمر

    المصدر: 2016 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2016 IEEE International. :6.7.1-6.7.3 Dec, 2016

    Relation: 2016 IEEE International Electron Devices Meeting (IEDM)