المؤلفون: James Hsu, Zhen Liu, Qiong-hua Mo, York Lu, Kai-jun Liu, An-Thung Cho, Wade Chen, Feng-yun Yang

المصدر: SID Symposium Digest of Technical Papers. 50:544-548

مصطلحات موضوعية: Materials science, Silicon, chemistry, business.industry, Product (mathematics), Optoelectronics, chemistry.chemical_element, Process architecture, business, Image (mathematics)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::0ed39f4148c513e56e66c06915108b39
https://doi.org/10.1002/sdtp.13556

المؤلفون: Feng-yun Yang, Qiong-hua Mo, Bang-tong Ge, Kai-jun Liu, Jeff Zhou, James Hsu, Wei Chao, Zhen Liu, York Lu, Ting-ting Fu, Wade Chen, An-Thung Cho

المصدر: SID Symposium Digest of Technical Papers. 50:822-825

مصطلحات موضوعية: Halftone, business.industry, Thin-film transistor, Computer science, law, Optoelectronics, Process architecture, Photolithography, business, law.invention

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b8c8f20d759b8d0b09ad8a3940b7445b
https://doi.org/10.1002/sdtp.13660

المؤلفون: Zhen Liu, Kai-jun Liu, Qiong-hua Mo, Feng-yun Yang, James Hsu, York Lu, Wade Chen, An-Thung Cho

المصدر: SID Symposium Digest of Technical Papers. 50:613-616

مصطلحات موضوعية: Halftone, Sensor array, Thin-film transistor, Computer science, business.industry, Photoelectric sensor, Fingerprint image, Process (computing), Computer vision, Artificial intelligence, Image sensor, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::973a4dc8ace735032edfdaf7af3b2482
https://doi.org/10.1002/sdtp.13587

المؤلفون: An-Thung Cho, Yun-qin Hu, Wade Chen, York Lu, Kai-jun Liu, Qiong-hua Mo, James Hsu

المصدر: SID Symposium Digest of Technical Papers. 50:645-649

مصطلحات موضوعية: Materials science, Thin-film transistor, Model simulation, Electronic engineering, Driver circuit, Large size

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::572ffdfabaee6c9e080cc71c3ad1da4d
https://doi.org/10.1002/sdtp.13598

المؤلفون: An-Thung Cho, James Hsu, Jeff Zhou, Jinn Hong, Feng-yun Yang, Yan-mei Luo, Yi-qun Tian, Dan Lei, Zhen Liu, Qiong-hua Mo, Kai-jun Liu, Bang-tong Ge, Feng-xiang Long, Ting-ting Fu, Min Li, Wade Chen, York Lu

المصدر: SID Symposium Digest of Technical Papers. 49:1471-1474

مصطلحات موضوعية: 010302 applied physics, 0103 physical sciences, 02 engineering and technology, 021001 nanoscience & nanotechnology, 0210 nano-technology, 01 natural sciences

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::e594d3a35adc30a4d7156b77ad022007
https://doi.org/10.1002/sdtp.12240

المؤلفون: York Lu, Kai-jun Liu, Zhen Liu, Qiong-hua Mo, Feng-yun Yang, Wade Chen, An-Thung Cho, James Hsu

المصدر: SID Symposium Digest of Technical Papers. 49:1024-1027

مصطلحات موضوعية: 010302 applied physics, Computer science, business.industry, Fingerprint (computing), 02 engineering and technology, Process architecture, 021001 nanoscience & nanotechnology, 01 natural sciences, Flat panel, Photodiode, law.invention, Thin-film transistor, law, 0103 physical sciences, Optoelectronics, Image sensor, 0210 nano-technology, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::4f360d311087e398b5080b10997aeea8
https://doi.org/10.1002/sdtp.12195

المؤلفون: Xiao-bin Fan, Chun-Yan Lin, Scott, James Hsu, York Lu, Qiong-hua Mo, An-Thung Cho, Wade Chen, Li-feng Wu

المصدر: SID Symposium Digest of Technical Papers. 50:549-551

مصطلحات موضوعية: Stress (mechanics), Materials science, Thin-film transistor, Spice, Model simulation, Large size, Reliability (statistics), Reliability engineering

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::2d17e34408b7b9f054b3b6b1dde68165
https://doi.org/10.1002/sdtp.13557

المؤلفون: An-Thung Cho, James Hsu, Feng-yun Yang, Zhen Liu, Wade Chen, Kai-jun Liu, York Lu

المصدر: SID Symposium Digest of Technical Papers. 50:381-383

مصطلحات موضوعية: business.industry, Computer science, Product (mathematics), Plasma treatment, Process architecture, Process engineering, business, Image (mathematics)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::893ee50d63b61de126a6f1bcce3bd669
https://doi.org/10.1002/sdtp.13500

المؤلفون: Rodriguez-Coleman H; Vitreous Retina Macula Consultants of New York, Lu Esther T. Mertz Retina Research Laboratory, New York, NY 10021, USA., Spaide RF, Yannuzzi LA

المصدر: Retina (Philadelphia, Pa.) [Retina] 2002 Apr; Vol. 22 (2), pp. 228-32.

نوع المنشور: Case Reports; Journal Article

بيانات الدورية: Publisher: Lippincott Williams & Wilkins Country of Publication: United States NLM ID: 8309919 Publication Model: Print Cited Medium: Print ISSN: 0275-004X (Print) Linking ISSN: 0275004X NLM ISO Abbreviation: Retina Subsets: MEDLINE

مواضيع طبية MeSH: Photochemotherapy*, Photosensitizing Agents/*therapeutic use , Porphyrins/*therapeutic use , Retinal Diseases/*drug therapy , Retinal Vessels/*drug effects , von Hippel-Lindau Disease/*drug therapy, Adult ; Female ; Fluorescein Angiography ; Humans ; Retinal Diseases/diagnosis ; Retinal Vessels/pathology ; Verteporfin ; Visual Acuity ; von Hippel-Lindau Disease/diagnosis