يعرض 1 - 10 نتائج من 52 نتيجة بحث عن '"Yoshimura, Masayoshi"', وقت الاستعلام: 0.80s تنقيح النتائج
  1. 1
    مؤتمر
    A Block Partitioning Method for Region Exhaustive Test to Reduce the Number of Test Patterns and Improve Gate Exhaustive Fault Coverage

    المؤلفون: Mizota, Momona, Hosokawa, Toshinori, Yoshimura, Masayoshi, Arai, Masayuki

    المصدر: 2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2023 IEEE International Symposium on. :1-6 Oct, 2023

    Relation: 2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)

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  2. 2
    مؤتمر
    An Evaluation of Estimated Field Random Testability for Data Paths at Register Transfer Level Using Status Signal Sequences Based on k-Consecutive State Transitions for Field Testing

    المؤلفون: Toyooka, Yudai, Watanabe, Haruki, Hosokawa, Toshinori, Yoshimura, Masayoshi

    المصدر: 2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2023 IEEE International Symposium on. :1-6 Oct, 2023

    Relation: 2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)

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  3. 3
    مؤتمر
    An Evaluation of a Testability Measure for State Assignment to Estimate Transition Fault Coverage for Controllers

    المؤلفون: Hosokawa, Toshinori, Iizuka, Kyohei, Yoshimura, Masayoshi

    المصدر: 2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2023 IEEE International Symposium on. :1-6 Oct, 2023

    Relation: 2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)

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  4. 4
    مؤتمر
    CRLock: A SAT and FALL Attacks Resistant Logic Locking Method at Register Transfer Level

    المؤلفون: Yoshimura, Masayoshi, Tsujikawa, Atsuya, Yamazaki, Hiroshi, Hosokawa, Toshinori

    المصدر: 2022 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2022 IEEE International Symposium on. :1-6 Oct, 2022

    Relation: 2022 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)

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  5. 5
    مؤتمر
    A Multiple Target Test Generation Method for Gate-Exhaustive Faults to Reduce the Number of Test Patterns Using Partial MaxSAT

    المؤلفون: Asami, Ryuki, Hosokawa, Toshinori, Yoshimura, Masayoshi, Arai, Masayuki

    المصدر: 2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2020 IEEE International Symposium on. :1-6 Oct, 2020

    Relation: 2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)

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  6. 6
    مؤتمر
    A Low Capture Power Oriented X-Identification-Filling Co-Optimization Method

    المؤلفون: Hosokawa, Toshinori, Misawa, Kenichiro, Yamazaki, Hiroshi, Yoshimura, Masayoshi, Arai, Masayuki

    المصدر: 2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS) On-Line Testing and Robust System Design (IOLTS), 2020 IEEE 26th International Symposium on. :1-4 Jul, 2020

    Relation: 2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS)

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  7. 7
    مؤتمر
    A State Assignment Method to Improve Transition Fault Coverage for Controllers

    المؤلفون: Yoshimura, Masayoshi, Takeuchi, Yuki, Yamazaki, Hiroshi, Hosokawa, Toshinori

    المصدر: 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2019 IEEE International Symposium on. :1-4 Oct, 2019

    Relation: 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)

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  8. 8
    مؤتمر
    A Controller Augmentation Method to Improve Transition Fault Coverage for RTL Data-Paths

    المؤلفون: Takeuchi, Yuki, Hosokawa, Toshinori, Yamazaki, Hiroshi, Yoshimura, Masayoshi

    المصدر: 2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS) On-Line Testing and Robust System Design (IOLTS ), 2019 IEEE 25th International Symposium on. :293-298 Jul, 2019

    Relation: 2019 IEEE 25th International Symposium on On-Line Testing And Robust System Design (IOLTS)

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  9. 9
    مؤتمر
    An Efficient SAT-Attack Algorithm Against Logic Encryption

    المؤلفون: Matsunaga, Yusuke, Yoshimura, Masayoshi

    المصدر: 2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS) On-Line Testing and Robust System Design (IOLTS ), 2019 IEEE 25th International Symposium on. :44-47 Jul, 2019

    Relation: 2019 IEEE 25th International Symposium on On-Line Testing And Robust System Design (IOLTS)

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  10. 10
    مؤتمر
    A Capture Safe Static Test Compaction Method Based on Don't Cares

    المؤلفون: Ochi, Sayuri, Yamazaki, Hiroshi, Hosokawa, Toshinori, Yoshimura, Masayoshi

    المصدر: 2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS) On-Line Testing And Robust System Design (IOLTS), 2018 IEEE 24th International Symposium on. :195-200 Jul, 2018

    Relation: 2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS)

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