المؤلفون: You Guo Feng, Tay Beng Kang, Li Xiao Cheng, Yang Yi, Sun Xiao Wei

المصدر: 2008 2nd IEEE International Nanoelectronics Conference Nanoelectronics Conference, 2008. INEC 2008. 2nd IEEE International. :1107-1111 Mar, 2008

Relation: 2008 2nd IEEE International Nanoelectronics Conference (NEC)

المؤلفون: Jeffrey Lam, You Guo Feng, Goh Szu Huat, Kannan Sekar, Yan Pan, Avinash Viswanatha, Atul Chittora

المصدر: International Symposium for Testing and Failure Analysis.

مصطلحات موضوعية: Engineering, Yield (engineering), business.industry, Deconvolution analysis, Electronic engineering, Root cause, business, Process engineering

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::efb03acb3118f1a24bda83c3a59a52c1
https://doi.org/10.31399/asm.cp.istfa2013p0602

المؤلفون: Sun Xiao Wei, Tay Beng Kang, Yang Yi, Li Xiao Cheng, You Guo Feng

المصدر: 2008 2nd IEEE International Nanoelectronics Conference.

مصطلحات موضوعية: Nanomanipulator, Nanostructure, Fabrication, Materials science, Nano, Nanowire, Nanotechnology, Fluidics, Substrate (printing), Characterization (materials science)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::5035db3890e8343db3ef6089fbf485a7
https://doi.org/10.1109/inec.2008.4585676

المؤلفون: You, Guo Feng

المساهمون: Tay, Beng Kang, School of Electrical and Electronic Engineering

مصطلحات موضوعية: Engineering::Materials::Microelectronics and semiconductor materials [DRNTU]

وصف الملف: application/pdf

URL الوصول: https://explore.openaire.eu/search/publication?articleId=od______1392::8687bed2f1b5159ef5e5d041afe8a301
http://hdl.handle.net/10356/3909

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المؤلفون: Thong, John T. L., Oon, Chin Hin, You, Guo Feng, Yeong, Kuan Song

المصدر: Proceedings of SPIE; Nov2002, Issue 1, p26-34, 9p