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1مؤتمر
المؤلفون: Kim, Yong Chae, Lee, Seungyun, Lee, Sang Kyung, Kim, Bongmo, Lee, Jiwon, Lee, Jinwook, Youn, Byeng D.
المصدر: 2024 IEEE International Conference on Prognostics and Health Management (ICPHM) Prognostics and Health Management (ICPHM), 2024 IEEE International Conference on. :15-22 Jun, 2024
Relation: 2024 IEEE International Conference on Prognostics and Health Management (ICPHM)
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2تقرير
المؤلفون: Thelen, Adam, Zhang, Xiaoge, Fink, Olga, Lu, Yan, Ghosh, Sayan, Youn, Byeng D., Todd, Michael D., Mahadevan, Sankaran, Hu, Chao, Hu, Zhen
مصطلحات موضوعية: Computer Science - Machine Learning, Mathematics - Optimization and Control
URL الوصول: http://arxiv.org/abs/2208.12904
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3تقرير
المؤلفون: Thelen, Adam, Zhang, Xiaoge, Fink, Olga, Lu, Yan, Ghosh, Sayan, Youn, Byeng D., Todd, Michael D., Mahadevan, Sankaran, Hu, Chao, Hu, Zhen
مصطلحات موضوعية: Computer Science - Computational Engineering, Finance, and Science, Computer Science - Artificial Intelligence, Computer Science - Machine Learning
URL الوصول: http://arxiv.org/abs/2208.14197
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4دورية أكاديمية
المؤلفون: Lee, Jinwook, Ko, Jin Uk, Kim, Taehun, Kim, Yong Chae, Jung, Joon Ha, Youn, Byeng D.
المصدر: In Expert Systems With Applications 1 June 2024 243
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5دورية أكاديمية
المؤلفون: Kim, Yong Chae, Lee, Jinwook, Kim, Taehun, Baek, Jonghwa, Ko, Jin Uk, Jung, Joon Ha, Youn, Byeng D.
المصدر: In Reliability Engineering and System Safety October 2024 250
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6دورية أكاديمية
المؤلفون: Lee, Seungyun, Kim, Sungjong, Kim, Su J., Lee, Jiwon, Yoon, Heonjun, Youn, Byeng D.
المصدر: In Expert Systems With Applications 1 October 2024 251
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7دورية أكاديمية
المؤلفون: Yoo, Jinoh, Park, Jongmin, Kim, Taehyung, Moon Ha, Jong, Youn, Byeng D.
المصدر: In Mechanical Systems and Signal Processing 1 April 2024 211
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8دورية أكاديمية
المؤلفون: Lee, Sang Kyung, Kim, Hyeongmin, Chae, Minseok, Oh, Hye Jun, Yoon, Heonjun, Youn, Byeng D.
المصدر: In Knowledge-Based Systems 15 March 2024 288
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9دورية أكاديمية
المؤلفون: Na, Kyumin, Kim, Yunhan, Yoon, Heonjun, Youn, Byeng D.
المصدر: In Expert Systems With Applications 15 March 2024 238 Part C
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10مؤتمر
المؤلفون: Park, Chan Hee, Lee, Junmin, Ahn, Giljun, Youn, Myeongbaek, Youn, Byeng D.
المصدر: 2019 IEEE 12th International Symposium on Diagnostics for Electrical Machines, Power Electronics and Drives (SDEMPED) Diagnostics for Electrical Machines, Power Electronics and Drives (SDEMPED), 2019 IEEE 12th International Symposium on. :88-93 Aug, 2019
Relation: 2019 IEEE 12th International Symposium on Diagnostics for Electrical Machines, Power Electronics and Drives (SDEMPED)