يعرض 1 - 10 نتائج من 224 نتيجة بحث عن '"Young-Soo Sohn"', وقت الاستعلام: 0.94s تنقيح النتائج
  1. 1
  2. 2
  3. 3
    مؤتمر

    المصدر: 2012 International SoC Design Conference (ISOCC) SoC Design Conference (ISOCC), 2012 International. :192-195 Nov, 2012

    Relation: 2012 International SoC Design Conference (ISOCC 2012)

  4. 4
    مؤتمر

    المصدر: 2016 IEEE Symposium on VLSI Circuits (VLSI-Circuits) VLSI Circuits (VLSI-Circuits), 2016 IEEE Symposium on. :1-2 Jun, 2016

    Relation: 2016 IEEE Symposium on VLSI Circuits

  5. 5
    مؤتمر

    المصدر: The Sixteenth Annual International Conference on Micro Electro Mechanical Systems, 2003. MEMS-03 Kyoto. IEEE Micro electro mechanical systems Micro Electro Mechanical Systems, 2003. MEMS-03 Kyoto. IEEE The Sixteenth Annual International Conference on. :447-450 2003

    Relation: Proceedings IEEE Sixteenth Annual International Conference on Micro Electro Mechanical Systems

  6. 6
    مؤتمر

    المصدر: Proceedings of the IEEE 2003 Custom Integrated Circuits Conference, 2003. Custom integrated circuits Custom Integrated Circuits Conference, 2003. Proceedings of the IEEE 2003. :473-476 2003

    Relation: CICC Custom Integrated Circuits Conference

  7. 7
    مؤتمر

    المصدر: Proceedings of the 28th European Solid-State Circuits Conference Solid-State Circuits Conference, 2002. ESSCIRC 2002. Proceedings of the 28th European. :787-790 2002

    Relation: Proceedings of the 28th European Solid-State Circuits Conference

  8. 8
    مؤتمر

    المصدر: ICVC '99. 6th International Conference on VLSI and CAD (Cat. No.99EX361) VLSI and CAD VLSI and CAD, 1999. ICVC '99. 6th International Conference on. :69-72 1999

    Relation: ICVC'99. 6th International Conference on VLSI and CAD

  9. 9
    دورية أكاديمية

    المصدر: IEEE Journal of Solid-State Circuits IEEE J. Solid-State Circuits Solid-State Circuits, IEEE Journal of. 41(1):127-134 Jan, 2006

  10. 10
    دورية أكاديمية

    المصدر: IEEE Journal of Solid-State Circuits IEEE J. Solid-State Circuits Solid-State Circuits, IEEE Journal of. 40(5):1119-1129 May, 2005