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1دورية أكاديمية
المؤلفون: Donggeun Kim, Younghwan Son
المصدر: Applied Sciences, Vol 13, Iss 18, p 10484 (2023)
مصطلحات موضوعية: void area curve, digital image processing, image thresholding, dry density, agricultural land, Technology, Engineering (General). Civil engineering (General), TA1-2040, Biology (General), QH301-705.5, Physics, QC1-999, Chemistry, QD1-999
وصف الملف: electronic resource
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2دورية أكاديمية
المؤلفون: Donggeun Kim, Taejin Kim, Jihun Jeon, Younghwan Son
المصدر: Applied Sciences, Vol 13, Iss 7, p 4430 (2023)
مصطلحات موضوعية: deep neural network, soil surface image, digital image processing, water content, bulk density, Technology, Engineering (General). Civil engineering (General), TA1-2040, Biology (General), QH301-705.5, Physics, QC1-999, Chemistry, QD1-999
وصف الملف: electronic resource
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3دورية أكاديمية
المؤلفون: Donggeun Kim, Taejin Kim, Jihun Jeon, Younghwan Son
المصدر: Applied Sciences, Vol 13, Iss 5, p 2936 (2023)
مصطلحات موضوعية: deep learning, convolutional neural network, soil properties, water content, dry density, Technology, Engineering (General). Civil engineering (General), TA1-2040, Biology (General), QH301-705.5, Physics, QC1-999, Chemistry, QD1-999
وصف الملف: electronic resource
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4دورية أكاديمية
المؤلفون: Donggeun Kim, Younghwan Son, Jaesung Park, Taejin Kim, Jihun Jeon
المصدر: Advances in Civil Engineering, Vol 2019 (2019)
مصطلحات موضوعية: Engineering (General). Civil engineering (General), TA1-2040
وصف الملف: electronic resource
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5دورية أكاديمية
المؤلفون: Taeho Bong, Younghwan Son
المصدر: Advances in Civil Engineering, Vol 2018 (2018)
مصطلحات موضوعية: Engineering (General). Civil engineering (General), TA1-2040
وصف الملف: electronic resource
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6دورية أكاديمية
المؤلفون: Donggeun Kim, Younghwan Son, Jaesung Park
المصدر: Advances in Civil Engineering, Vol 2018 (2018)
مصطلحات موضوعية: Engineering (General). Civil engineering (General), TA1-2040
وصف الملف: electronic resource
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7مؤتمر
المؤلفون: Younghwan Son, Jaehong Lee, Jaeho Lee, Shin, Hyungcheol
المصدر: 18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2011 18th IEEE International Symposium on the. :1-4 Jul, 2011
Relation: 2011 18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2011)
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8مؤتمر
المؤلفون: Sanghoon Lee, Heung-Jae Cho, Younghwan Son, Lee, Dong Seup, Shin, Hyungcheol
المصدر: 2009 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2009 IEEE International. :1-4 Dec, 2009
Relation: 2009 IEEE International Electron Devices Meeting (IEDM)
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9مؤتمر
المؤلفون: Younghwan Son, Chang-Ki Baek, Bomsoo Kim, In-Shik Han, Tae-Gyu Goo, Ooksang You, Wonho Choi, Hee-Hwan Ji, Hi-Deok Lee, Kim, Dae M.
المصدر: 2006 IEEE Nanotechnology Materials and Devices Conference Nanotechnology Materials and Devices Conference, 2006. NMDC 2006. IEEE. 1:510-511 Oct, 2006
Relation: 2006 IEEE Nanotechnology Materials and Devices Conference
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10
المؤلفون: Donggeun Kim, Taejin Kim, Jihun Jeon, Younghwan Son
المصدر: Paddy and Water Environment. 20:277-286
مصطلحات موضوعية: Environmental Engineering, Agronomy and Crop Science, Water Science and Technology