المؤلفون: Hui, Christy Lai-Ming, Wong, Stephanie Ming-Yin, Yu, Terrence Yat-To, Lau, Terry Tak-Yee, Choi, Olivia, Tsang, Samantha, Suen, Yi-Nam, Lam, Bess Yin-Hung, Wong, Corine Sau-Man, Lui, Simon Sai-Yu, Chan, Kai-Tai, Wong, Michael Tak-Hing, Wong, Gloria Hoi-Yan, Chan, Sherry Kit-Wa^{Aff1, Aff3}, Lee, Edwin Ho-Ming, Chang, Wing-Chung^{Aff1, Aff3}, Wilkins, Arnold, Chen, Eric Yu-Hai^{Aff1, Aff3, IDs00406022014697_cor18}

المصدر: European Archives of Psychiatry and Clinical Neuroscience. 273(5):1051-1060

المؤلفون: Shih, Victor, Cheng, Sean, Lin, You-Ru, Lin, Anderson, Liao, Yan-Jie, Lin, Ching-Hui, Huang, Fu-Chun, Tai, Kelvin, Hu, Fan, Tsai, Yi-Heng, Chen, Yen-Wen, Chang, Kai-Fung, Chiu, Ching-Hua, Tsai, Leo, Teng, Vincent, Chen, Chih-Ming, Yu, Terrence, Tu, Yeur-Luen, Tseng, Lee-Chuan, Lee, Julian, Chen, Benior, Huang, Shih-Fen, Kalnitsky, Alexander

المصدر: 2019 20th International Conference on Solid-State Sensors, Actuators and Microsystems & Eurosensors XXXIII (TRANSDUCERS & EUROSENSORS XXXIII) Solid-State Sensors, Actuators and Microsystems & Eurosensors XXXIII (TRANSDUCERS & EUROSENSORS XXXIII), 2019 20th International Conference on. :190-193 Jun, 2019

Relation: 2019 20th International Conference on Solid-State Sensors, Actuators and Microsystems & Eurosensors XXXIII (TRANSDUCERS & EUROSENSORS XXXIII)

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المؤلفون: Trinh, Hai-Dang, Lin, Yueh-Chin, Kuo, Chien-I, Chang, Edward Yi, Nguyen, Hong-Quan, Wong, Yuen-Yee, Yu, Chih-Chieh, Chen, Chi-Ming, Chang, Chia-Yuan, Wu, Jyun-Yi, Chiu, Han-Chin, Yu, Terrence, Chang, Hui-Cheng, Tsai, Joseph, Hwang, David

المصدر: Journal of Electronic Materials. August 2013 42(8):2439-2444

المؤلفون: Trinh, Hai-Dang, Lin, Yueh-Chin, Kuo, Chien-I, Chang, Edward, Nguyen, Hong-Quan, Wong, Yuen-Yee, Yu, Chih-Chieh, Chen, Chi-Ming, Chang, Chia-Yuan, Wu, Jyun-Yi, Chiu, Han-Chin, Yu, Terrence, Chang, Hui-Cheng, Tsai, Joseph, Hwang, David

المصدر: Journal of Electronic Materials; Aug2013, Vol. 42 Issue 8, p2439-2444, 6p, 6 Graphs

مصطلحات موضوعية: METAL oxide semiconductors, CAPACITANCE-voltage characteristics, HYSTERESIS, X-ray photoelectron spectroscopy, SURFACE preparation