نتائج البحث - "Yu-Der Chih"

المصدر: 2007 IEEE International Workshop on Memory Technology, Design and Testing Memory Technology, Design and Testing, 2007. MTDT 2007. IEEE International Workshop on. :65-66 Dec, 2007

Relation: 2007 IEEE International Workshop on Memory Technology, Design and Testing (MTDT)

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8-b Precision 8-Mb ReRAM Compute-in-Memory Macro Using Direct-Current-Free Time-Domain Readout Scheme for AI Edge Devices

المؤلفون: Je-Min Hung, Tai-Hao Wen, Yen-Hsiang Huang, Sheng-Po Huang, Fu-Chun Chang, Chin-I Su, Win-San Khwa, Chung-Chuan Lo, Ren-Shuo Liu, Chih-Cheng Hsieh, Kea-Tiong Tang, Yu-Der Chih, Tsung-Yung Jonathan Chang, Meng-Fan Chang

المصدر: IEEE Journal of Solid-State Circuits. 58:303-315

مصطلحات موضوعية: Electrical and Electronic Engineering

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::6d586e2b8feb4cc3ce47fd93d9655600
https://doi.org/10.1109/jssc.2022.3200515

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A 22-nm 1-Mb 1024-b Read Data-Protected STT-MRAM Macro With Near-Memory Shift-and-Rotate Functionality and 42.6-GB/s Read Bandwidth for Security-Aware Mobile Device

المؤلفون: Peng Chen, Cheng-Xin Xue, Yier Jin, Yi-Chun Shih, Chieh-Pu Lo, Chun-Ying Lee, Je-Min Hung, Hsiao-Yu Huang, Ssu-Yen Wu, Meng-Fan Chang, Yu-Der Chih, Shih-Hsih Teng, Tsung-Yung Jonathan Chang, Kuang-Tang Chang, Hui-Yao Kao, Yen-Cheng Chiu, Tung-Cheng Chang

المصدر: IEEE Journal of Solid-State Circuits. 57:1936-1949

مصطلحات موضوعية: Magnetoresistive random-access memory, business.industry, Computer science, Electrical engineering, Bandwidth (computing), Electrical and Electronic Engineering, Macro, business, Mobile device

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::8d1f28e76a6523b9097699109c8cda7a
https://doi.org/10.1109/jssc.2021.3112182

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A 22nm 8Mb STT-MRAM Near-Memory-Computing Macro with 8b-Precision and 46.4-160.1TOPS/W for Edge-AI Devices

المؤلفون: Yen-Cheng Chiu, Win-San Khwa, Chung-Yuan Li, Fang-Ling Hsieh, Yu-An Chien, Guan-Yi Lin, Po-Jung Chen, Tsen-Hsiang Pan, De-Qi You, Fang-Yi Chen, Andrew Lee, Chung-Chuan Lo, Ren-Shuo Liu, Chih-Cheng Hsieh, Kea-Tiong Tang, Yu-Der Chih, Tsung-Yung Chang, Meng-Fan Chang

المصدر: 2023 IEEE International Solid- State Circuits Conference (ISSCC).

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::bd4549f5b41a9e22c27962b0041d0f6a
https://doi.org/10.1109/isscc42615.2023.10067563

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33.1 A 16nm 32Mb Embedded STT-MRAM with a 6ns Read-Access Time, a 1M-Cycle Write Endurance, 20-Year Retention at 150°C and MTJ-OTP Solutions for Magnetic Immunity

المؤلفون: Po-Hao Lee, Chia-Fu Lee, Yi-Chun Shih, Hon-Jarn Lin, Yen-An Chang, Cheng-Han Lu, Yu-Lin Chen, Chieh-Pu Lo, Chung-Chieh Chen, Cheng-Hsiung Kuo, Tan-Li Chou, Chia-Yu Wang, J. J. Wu, Roger Wang, Harry Chuang, Yih Wang, Yu-Der Chih, Tsung-Yung Jonathan Chang

المصدر: 2023 IEEE International Solid- State Circuits Conference (ISSCC).

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::37a7a8f853f95421cc65095b140ce9af
https://doi.org/10.1109/isscc42615.2023.10067837

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A Nonvolatile Al-Edge Processor with 4MB SLC-MLC Hybrid-Mode ReRAM Compute-in-Memory Macro and 51.4-251TOPS/W

المؤلفون: Wei-Hsing Huang, Tai-Hao Wen, Je-Min Hung, Win-San Khwa, Yun-Chen Lo, Chuan-Jia Jhang, Huna-Hsi Hsu, Yu-Hsiana Chin, Yu-Chiao Chen, Chuna-Chuan Lo, Ren-Shuo Liu, Kea-Tiong Tang, Chih-Cheng Hsieh, Yu-Der Chih, Tsung-Yung Chang, Meng-Fan Chang

المصدر: 2023 IEEE International Solid- State Circuits Conference (ISSCC).

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::8e0d1752d47e2a98730da7bdc371dda8
https://doi.org/10.1109/isscc42615.2023.10067610

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A 73.53TOPS/W 14.74TOPS Heterogeneous RRAM In-Memory and SRAM Near-Memory SoC for Hybrid Frame and Event-Based Target Tracking

المؤلفون: Muya Chang, Ashwin Sanjay Lele, Samuel D. Spetalnick, Brian Crafton, Shota Konno, Zishen Wan, Ashwin Bhat, Win-San Khwa, Yu-Der Chih, Meng-Fan Chang, Arijit Raychowdhury

المصدر: 2023 IEEE International Solid- State Circuits Conference (ISSCC).

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::e0856219c4c0e1219fed90a9984be842
https://doi.org/10.1109/isscc42615.2023.10067544

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