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المؤلفون: Yuan, J.-S., Chen, S.

المصدر: IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 12(3):576-581 Sep, 2012

المؤلفون: Yuan, J.-S., Yen, H.-D., Chen, S., Wang, R.-L., Huang, G.-W., Juang, Y.-Z., Tu, C.-H., Yeh, W.-K., Ma, J.

المصدر: IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 12(2):369-375 Jun, 2012

المؤلفون: Zhang, Y., Yuan, J.-S.

المصدر: IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 12(2):376-381 Jun, 2012

المؤلفون: Yang, B., Yuan, J.-S., Shen, Z. J.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 58(11):4004-4010 Nov, 2011

المؤلفون: Chen, S., Yuan, J.-S.

المصدر: IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 11(3):442-449 Sep, 2011

المؤلفون: Liu, Y., Yuan, J.-S.

المصدر: IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 11(3):450-457 Sep, 2011

المؤلفون: Steighner, J. B., Yuan, J.-S.

المصدر: IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 11(2):254-262 Jun, 2011

المؤلفون: Sun, S., Yuan, J.-S., Shen, Z. J.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 58(5):1517-1522 May, 2011

المؤلفون: Chen, Y-T., Chen, K-M., Yeh, W-K., Yuan, J-S., Yeh, F-S.

المصدر: IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 11(1):44-49 Mar, 2011