المؤلفون: Xinhuan Yang, Qianqian Sang, Chuanzheng Wang, Mingyan Yu, Yuanfu Zhao

المصدر: IEEE Journal of the Electron Devices Society, Vol 11, Pp 179-189 (2023)

مصطلحات موضوعية: Aging model, circuit reliability, bias temperature instability (BTI), hot-carrier injection (HCI), SPICE simulation, Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

Relation: https://ieeexplore.ieee.org/document/10058971/; https://doaj.org/toc/2168-6734

URL الوصول: https://doaj.org/article/76ff7c673f024195b26807e202ddedf7

المؤلفون: Lichun Mei, Huaiye Wang, Caiyun Wang, Yuanfu Zhao, Jun Zhang, Xiaoxia Zhao

المصدر: IEEE Access, Vol 10, Pp 113376-113396 (2022)

مصطلحات موضوعية: Template matching, multimodal image, heterogeneous image, multisource image, visible and infrared image, image matching, Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

Relation: https://ieeexplore.ieee.org/document/9930487/; https://doaj.org/toc/2169-3536

URL الوصول: https://doaj.org/article/af354cb051e14654b3d9f88861bebba3

المؤلفون: Xinyu Li, Yunpeng Jia, Xintian Zhou, Yuanfu Zhao, Yu Wu, Dongqing Hu, Xingyu Fang, Zhonghan Deng

المصدر: IEEE Journal of the Electron Devices Society, Vol 9, Pp 839-845 (2021)

مصطلحات موضوعية: Split-gate-trench MOSFET, built-in channel diode, reverse recovery characteristics, figure of merit, current distribution, Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

Relation: https://ieeexplore.ieee.org/document/9542929/; https://doaj.org/toc/2168-6734

URL الوصول: https://doaj.org/article/ac524d95b4644f44b857ea72fa796904

المؤلفون: Xintian Zhou, Hao Gong, Yunpeng Jia, Dongqing Hu, Yu Wu, Tian Xia, Haoyang Pang, Yuanfu Zhao

المصدر: IEEE Journal of the Electron Devices Society, Vol 8, Pp 619-625 (2020)

مصطلحات موضوعية: SiC planar MOSFETs, bipolar degradation, dynamic performance, Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

Relation: https://ieeexplore.ieee.org/document/9113489/; https://doaj.org/toc/2168-6734

URL الوصول: https://doaj.org/article/b2b25da3322c4933afa346b8dde62d0c

المؤلفون: Liyan, Liu, Qingwei, Zhu, Shan, Dong, Liang, Wang, Yuanfu, Zhao

المصدر: 2018 International Conference on Radiation Effects of Electronic Devices (ICREED) Radiation Effects of Electronic Devices (ICREED), 2018 International Conference on. :1-3 May, 2018

Relation: 2018 International Conference on Radiation Effects of Electronic Devices (ICREED)

المؤلفون: Danhui Wang, Yuanfu Zhao, Suge Yue

المصدر: 2015 China Semiconductor Technology International Conference Semiconductor Technology International Conference (CSTIC), 2015 China. :1-4 Mar, 2015

Relation: 2015 China Semiconductor Technology International Conference (CSTIC)

المؤلفون: Hongshuo, Zhang, Yuanfu, Zhao, Quanbin, Yao, Yusheng, Cao

المصدر: 2013 14th International Conference on Electronic Packaging Technology Electronic Packaging Technology (ICEPT), 2013 14th International Conference on. :968-971 Aug, 2013

Relation: 2013 14th International Conference on Electronic Packaging Technology (ICEPT)

المؤلفون: Yimao Cai, Yuanfu Zhao, Lidong Lan

المصدر: 2011 International Conference on System science, Engineering design and Manufacturing informatization System Science, Engineering Design and Manufacturing Informatization (ICSEM), 2011 International Conference on. 2:360-363 Oct, 2011

Relation: 2011 International Conference on System Science, Engineering Design and Manufacturing Informatization (ICSEM)

المؤلفون: Lin Liu, Yuanfu Zhao, Suge Yue, Jiancheng Li, Shijing Lu, Yantu Mo, Longjie Su, Xiaocheng Zhang

المصدر: 2010 Second International Conference on Communication Systems, Networks and Applications Communication Systems, Networks and Applications (ICCSNA), 2010 Second International Conference on. 1:316-320 Jun, 2010

Relation: 2010 Second International Conference on Communication Systems, Networks and Applications (ICCSNA)

المؤلفون: Qiang Bian, Zushu Yan, Yuanfu Zhao, Suge Yue

المصدر: 2005 IEEE Conference on Electron Devices and Solid-State Circuits Electron Devices and Solid-State Circuits, 2005 IEEE Conference on. :363-366 2005

Relation: 2005 IEEE Conference on Electron Devices and Solid-State Circuits