المؤلفون: Sang-Hyeon Kim, Ilpyo Roh, Jae-Hoon Han, Dae-Myeong Geum, Seong Kwang Kim, Soo Seok Kang, Hang-Kyu Kang, Woo Chul Lee, Seong Keun Kim, Do Kyung Hwang, Yun Heub Song, Jin Dong Song

المصدر: IEEE Journal of the Electron Devices Society, Vol 9, Pp 42-48 (2021)

مصطلحات موضوعية: GaSb, III-V, ultra-thin-body (UTB), InGaAs passivation, Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

Relation: https://ieeexplore.ieee.org/document/9264257/; https://doaj.org/toc/2168-6734

URL الوصول: https://doaj.org/article/e14f70b92ca14adebb389839bfcd79c5

المؤلفون: Seungdo Choi, Youngil Kim, Daeyong Lee, Sangjin Lee, Kibin Park, Yun Heub Song, Yong Ho Song

المصدر: IEEE Access, Vol 7, Pp 149583-149594 (2019)

مصطلحات موضوعية: Accelerator architectures, data compression, field programmable gate arrays, Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

Relation: https://ieeexplore.ieee.org/document/8868070/; https://doaj.org/toc/2169-3536

URL الوصول: https://doaj.org/article/06507c44e45c4bf5ac6b28b3dd15cf0f

المؤلفون: Jae-Min Sim, In-Ku Kang, Sung-In Hong, Changhan Kim, Changhyun Cho, Kyunghoon Min, Yun-Heub Song

المصدر: Memories - Materials, Devices, Circuits and Systems, Vol 5, Iss , Pp 100073- (2023)

مصطلحات موضوعية: 3D NAND flash memory, Gate-all-around with back gate (GAAB), Pass disturbance, Program disturbance, Program operation, Self-boosting, Electric apparatus and materials. Electric circuits. Electric networks, TK452-454.4, Computer engineering. Computer hardware, TK7885-7895

وصف الملف: electronic resource

Relation: http://www.sciencedirect.com/science/article/pii/S2773064623000506; https://doaj.org/toc/2773-0646

URL الوصول: https://doaj.org/article/ae1c1d950a9a46879de5e03f422cabc2

المؤلفون: Hyung-Jun, Yang, Gae-Hun, Lee, Yun-Heub, Song

المصدر: 2014 4th IEEE International Conference on Network Infrastructure and Digital Content Network Infrastructure and Digital Content (IC-NIDC), 2014 4th IEEE International Conference on. :200-203 Sep, 2014

Relation: 2014 4th IEEE International Conference on Network Infrastructure and Digital Content (IC-NIDC)

المؤلفون: Taeung No, Seonjun Choi, Gaeryun Sung, Seong-Beom Kim, Jaeduk Han, Yun-Heub Song

المصدر: IEEE Access, Vol 10, Pp 53513-53521 (2022)

مصطلحات موضوعية: Discharge, phase-change memories, sensors, snapback currents, Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

Relation: https://ieeexplore.ieee.org/document/9775934/; https://doaj.org/toc/2169-3536

URL الوصول: https://doaj.org/article/ffcfcac47efa4a2db1c1b37f9b14a0d4

المؤلفون: Soo‐Min Jin, Shin‐Young Kang, Hea‐Jee Kim, Ju‐Young Lee, In‐Ho Nam, Tae‐Hun Shim, Yun‐Heub Song, Jea‐Gun Park

المصدر: Electronics Letters, Vol 58, Iss 1, Pp 38-40 (2022)

مصطلحات موضوعية: Sputter deposition, Memory circuits, Semiconductor storage, Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

Relation: https://doaj.org/toc/0013-5194; https://doaj.org/toc/1350-911X

URL الوصول: https://doaj.org/article/80683cc1d6544114bbd798f46ae2033e

المؤلفون: Shogo Hatayama, Takuya Yamamoto, Shunsuke Mori, Yun-Heub Song, Yuji Sutou

المصدر: ACS Applied Materials & Interfaces. 14:44604-44613

مصطلحات موضوعية: General Materials Science

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::fd57e336c3b09d900fcd9a9c607bd7be
https://doi.org/10.1021/acsami.2c13189

المؤلفون: Yi Shuang, Shunsuke Mori, Takuya Yamamoto, Shogo Hatayama, Yun-Heub Song, JinPyo Hong, Daisuke Ando, Yuji Sutou

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::8f0c98968eb7bc05c5a33197543e3813
https://doi.org/10.21203/rs.3.rs-2486043/v1

المؤلفون: Chang Hyun Lee, Kyung In Choi, Myoung Kwan Cho, Yun Heub Song, Kyu Charn Park, Kinam Kim

المصدر: IEEE International Electron Devices Meeting 2003 Electron devices IEDM'03 Electron Devices Meeting, 2003. IEDM '03 Technical Digest. IEEE International. :26.5.1-26.5.4 2003

Relation: IEEE International Electron Devices Meeting 2003

المؤلفون: Takuya Yamamoto, Shogo Hatayama, Yun-Heub Song, Yuji Sutou

المصدر: Materials Research Express, Vol 8, Iss 11, p 115902 (2021)

مصطلحات موضوعية: phase change material, thomson effect, contact resistance, numerical simulation, dimensionless number, Buckingham’s Π theorem, Materials of engineering and construction. Mechanics of materials, TA401-492, Chemical technology, TP1-1185

وصف الملف: electronic resource

Relation: https://doaj.org/toc/2053-1591

URL الوصول: https://doaj.org/article/16cdc15cdc384e44ae21dc5bdbdfc1b4