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1
المؤلفون: Yunbong Lee, Kun-Ok Ahn, Sung Ho Kim, Myeongwon Lee, Jaekwan Lee, Jinwoong Kim, Myoungkwan Cho, Gil-Bok Choi
المصدر: IRPS
مصطلحات موضوعية: Hardware_MEMORYSTRUCTURES, Materials science, Nand flash memory, business.industry, Noise reduction, Electrical engineering, NAND gate, Hardware_PERFORMANCEANDRELIABILITY, Temperature measurement, Threshold voltage, Non-volatile memory, Charge trap flash, Hardware_INTEGRATEDCIRCUITS, Process optimization, Hardware_ARITHMETICANDLOGICSTRUCTURES, business, Hardware_LOGICDESIGN
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::8749693dd64682c138d999209c94b4cd
https://doi.org/10.1109/irps.2015.7112811 -
2
المؤلفون: Hae chang Yang, Sukkwang Park, Gi-Hyun Bae, Sangjo Lee, Milim Park, Yunbong Lee, Min Sang Park, Pyunghwa Kim, Jiyul Park, Sungjo Park, Sunghoon Cho, Byoungjun Park, Sungwook Park, Myoung Kwan Cho, Kun-Ok Ahn
المصدر: 2012 4th IEEE International Memory Workshop.
مصطلحات موضوعية: Hardware_MEMORYSTRUCTURES, Materials science, Dopant, business.industry, Doping, NAND gate, Capacitance, Flash memory, Non-volatile memory, Reliability (semiconductor), Hardware_INTEGRATEDCIRCUITS, Electronic engineering, Optoelectronics, Electric potential, Hardware_ARITHMETICANDLOGICSTRUCTURES, business, Hardware_LOGICDESIGN
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::02e6b8b01da4ba7303410b8b3e7f4e69
https://doi.org/10.1109/imw.2012.6213622 -
3
المؤلفون: DaeHwan Yun, Hae chang Yang, Yunbong Lee, Ji Yul Park, Kun-Ok Ahn, YeonJoo Jeong, Yo-Hwan Koh, Myoung Kwan Cho, Byoungjun Park, Pyoung Hwa Kim
المصدر: 2010 IEEE International Memory Workshop.
مصطلحات موضوعية: Flash (photography), Engineering, Hardware_GENERAL, business.industry, Logic gate, Electronic engineering, Process (computing), Triple level cell, NAND gate, Charge loss, business, Flash memory, Hot-carrier injection
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::3cb50229b49bdf726d12609a4dc6913c
https://doi.org/10.1109/imw.2010.5488388 -
4
المؤلفون: Kwan-Yong Lim, H.-S. Yang, Yong-Taik Kim, Seung-Woo Shin, W.-K. Ma, G.-H. Kim, Se-kyoung Choi, S.-R. Won, Kyeong-Keun Choi, Yong Soo Kim, Seung Ryong Lee, Whoi-Yul Kim, S.-A. Jang, J.-H. Han, H.-J. Cho, Y.-S. Chun, Y.-K. Jung, Tae-Un Youn, Se-Jun Kim, Yunbong Lee, Jin Kim, S.-Y. Koo, Min Gyu Sung, Seung-Ho Pyi, Kyungdo Kim, J.-K. Lee, T.-K. Oh, Y.-T. Hwang
المصدر: 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual.
مصطلحات موضوعية: Materials science, Diffusion barrier, business.industry, Polymetal, Oxide, chemistry.chemical_element, Dielectric, Tungsten, chemistry.chemical_compound, chemistry, Gate oxide, Electronic engineering, Optoelectronics, Diffusion (business), business, AND gate
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b171a493bc75ceb6146dd16b7ec200c0
https://doi.org/10.1109/relphy.2007.369975 -
5
المؤلفون: Su-Birm Park, Yunbong Lee, Jae Joon Kim
المصدر: Electronics Letters. 40:1031
مصطلحات موضوعية: Materials science, Electronic oscillator, business.industry, Ring oscillator, LC circuit, Resonator, Vackář oscillator, Voltage-controlled oscillator, CMOS, Phase noise, Electronic engineering, Optoelectronics, Electrical and Electronic Engineering, business
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6مؤتمر
المؤلفون: Yunbong Lee, Byoungjun Park, DaeHwan Yun, YeonJoo Jeong, Pyoung Hwa Kim, Ji Yul Park, Hae Chang Yang, Myoung Kwan Cho, Kun-Ok Ahn, Yohwan Koh
المصدر: 2010 IEEE International Memory Workshop (IMW); 2010, p1-2, 2p