المؤلفون: Dongjin Jung, Hyunho Kim, Yoonjong Song, Nakwon Jang, Bonjae Koo, Sungyung Lee, Soonoh Park, Yungwook Park, Kinam Kim

المصدر: International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138) Electron devices meeting Electron Devices Meeting, 2000. IEDM '00. Technical Digest. International. :801-804 2000

Relation: International Electron Devices Meeting. Technical Digest. IEDM

المؤلفون: Sung-Yung Lee, Nak-Won Jang, Soon-oh Park, Hyunho Kim, Bon-jae Koo, Dong-Jin Jung, Kinam Kim, Yoon-Jong Song, Yungwook Park

المصدر: International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138).

مصطلحات موضوعية: Materials science, business.industry, Electrical engineering, chemistry.chemical_element, Fatigue testing, Ferroelectric capacitor, law.invention, Capacitor, chemistry, law, Electrode, Optoelectronics, Iridium, Thin film, business, Platinum, Polarization (electrochemistry)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::37775977543296a8a5c12adf5c006929
https://doi.org/10.1109/iedm.2000.904439

المؤلفون: Dongjin Jung, Hyunho Kim, Yoonjong Song, Nakwon Jang, Bonjae Koo, Sungyung Lee, Soonoh Park, Yungwook Park, Kinam Kim

المصدر: International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138); 2000, p801-804, 4p