نتائج البحث - "Yuyang Bian"

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دورية أكاديمية

Numerical Investigation on the Mechanism of Transpiration Cooling for Porous Struts Based on Local Thermal Non-Equilibrium Model

المؤلفون: Haiwei Yang, Xue Liu, Yuyang Bian, Ge Wang

المصدر: Energies, Vol 15, Iss 6, p 2091 (2022)

مصطلحات موضوعية: transpiration cooling, porous medium, strut, numerical investigation, local thermal non-equilibrium model, Technology

وصف الملف: electronic resource

Relation: https://www.mdpi.com/1996-1073/15/6/2091; https://doaj.org/toc/1996-1073

URL الوصول: https://doaj.org/article/8fe63e3750ec4b4483aacf6d3f578641

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2

مؤتمر

A differential scheme for Spatial Modulation

المؤلفون: Yuyang Bian, Wen, Miaowen, Cheng, Xiang, Poor, H. Vincent, Jiao, Bingli

المصدر: 2013 IEEE Global Communications Conference (GLOBECOM) Global Communications Conference (GLOBECOM), 2013 IEEE. :3925-3930 Dec, 2013

Relation: GLOBECOM 2013 - 2013 IEEE Global Communications Conference

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Process window improvement for fin cut layer in self-aligned double-patterning process based on backscattered electron imaging

المؤلفون: Yu Zhang, David Wei Zhang, Yuyang Bian, Biqiu Liu, Cong Zhang, Jun Huang, Jiawang Song, Yang Gao, Qiang Zhou, Wei Chen, Siqun Xiao, Shmuel Ben Nissim, Kevin Houchens, Omri Baum, Amit Zakay, Tal Ayzik, Yaniv Abramovitz

المصدر: Journal of Micro/Nanopatterning, Materials, and Metrology. 21

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::132931604fa8372bd4ac7cc9d438b449
https://doi.org/10.1117/1.jmm.21.4.041605

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Bottom grating asymmetry-induced inaccuracy in diffraction-based overlay measurement

المؤلفون: Yu Zhang, David Wei Zhang, Yuyang Bian, Biqiu Liu, Cong Zhang, Jun Huang

المصدر: Journal of Micro/Nanopatterning, Materials, and Metrology. 21

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::9d1bec03eadbb15ff48111f3df00aab4
https://doi.org/10.1117/1.jmm.21.3.034001

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A holistic study of edge placement error on fin cut layer in self-aligned double patterning process

المؤلفون: Yuyang Bian, Biqiu Liu, Xijun Guan, Xiaobo Guo, Cong Zhang, Wenzhan Zhou, Jun Huang, Yu Zhang, Jiawang Song, Yang Gao, Shmuel Nissim, Kevin Houchens, Omri Baum, Qiang Zhou, Zaisan Yang, Amit Zakay, Tal Ayzik, Yaniv Abramovitz

المصدر: Metrology, Inspection, and Process Control XXXVI.

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::a5cda6b86bb61fe7eb7eee181d776b72
https://doi.org/10.1117/12.2614221

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Investigation on heat transfer during transpiration cooling with hydrocarbon fuel coolant

المؤلفون: Xue Liu, Yuyang Bian, Weixing Zhou, Chuanwei Wu, Zhenjian Jia

المصدر: International Journal of Heat and Mass Transfer. 200:123507

مصطلحات موضوعية: Fluid Flow and Transfer Processes, Mechanical Engineering, Condensed Matter Physics

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::58d44ab6b267beffb932ce4496b66132
https://doi.org/10.1016/j.ijheatmasstransfer.2022.123507

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7

Dose control strategy using random logic device patterns and massive metrology in a foundry high volume manufacturing environment

المصدر: 2021 International Workshop on Advanced Patterning Solutions (IWAPS).

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::72f72295ee02e96ab1c0f80e10d684ae
https://doi.org/10.1109/iwaps54037.2021.9671240

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A Study of Overlay Accuracy Improvement on Process Induced Asymmetry Effect

المؤلفون: Yuyang Bian, Xijun Guan, Biqiu Liu, Xiaobo Guo, Cong Zhang, Wenzhan Zhou, Jun Huang, Yu Zhang, Lingyi Guo, Faquan Liu, Jinyan Song, Chunfei Sui

المصدر: 2021 International Workshop on Advanced Patterning Solutions (IWAPS).

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::86d68e7a03d1f90d926b5baa45ea0ce4
https://doi.org/10.1109/iwaps54037.2021.9671066

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The importance of in-die sampling using E-beam solution on yield improvement

المؤلفون: Yu Zhang, Yuyang Bian, Yaniv Abramovitz, Yifei Zhu, Omri Baum, Alexander Vipolzov, Qiang Zhou, Biqiu Liu, Song Gao, Shmuel Ben Nissim, Cong Zhang, Uri Smolyan, Jun Huang, Xiaobo Guo

المصدر: Metrology, Inspection, and Process Control for Semiconductor Manufacturing XXXV.

مصطلحات موضوعية: Accuracy and precision, Sampling (signal processing), Computer science, Line (geometry), Electronic engineering, Process (computing), Node (circuits), Overlay, Critical dimension, Die (integrated circuit)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::d7038abbb89ac80e8855e45f742b2d35
https://doi.org/10.1117/12.2585391

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Effects of lithography process conditions on unbiased line roughness by PSD analysis

المؤلفون: Xijun Guan, Xiaobo Guo, Yujie Xu, Cong Zhang, Yuyang Bian, Biqiu Liu, Dandan Hu, Song Gao, Yu Zhang, Lulu Lai, Jun Huang, Yongyu Yuan

المصدر: Metrology, Inspection, and Process Control for Semiconductor Manufacturing XXXV.

مصطلحات موضوعية: Optics, Materials science, Resist, Scanning electron microscope, business.industry, Cathode ray, Spectral density, Surface finish, Edge (geometry), business, Lithography, Noise (electronics)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::3a130d25421b3b26293325f828e6075e
https://doi.org/10.1117/12.2583545

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