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1دورية أكاديمية
المؤلفون: Haiwei Yang, Xue Liu, Yuyang Bian, Ge Wang
المصدر: Energies, Vol 15, Iss 6, p 2091 (2022)
مصطلحات موضوعية: transpiration cooling, porous medium, strut, numerical investigation, local thermal non-equilibrium model, Technology
وصف الملف: electronic resource
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2مؤتمر
المؤلفون: Yuyang Bian, Wen, Miaowen, Cheng, Xiang, Poor, H. Vincent, Jiao, Bingli
المصدر: 2013 IEEE Global Communications Conference (GLOBECOM) Global Communications Conference (GLOBECOM), 2013 IEEE. :3925-3930 Dec, 2013
Relation: GLOBECOM 2013 - 2013 IEEE Global Communications Conference
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3
المؤلفون: Yu Zhang, David Wei Zhang, Yuyang Bian, Biqiu Liu, Cong Zhang, Jun Huang, Jiawang Song, Yang Gao, Qiang Zhou, Wei Chen, Siqun Xiao, Shmuel Ben Nissim, Kevin Houchens, Omri Baum, Amit Zakay, Tal Ayzik, Yaniv Abramovitz
المصدر: Journal of Micro/Nanopatterning, Materials, and Metrology. 21
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::132931604fa8372bd4ac7cc9d438b449
https://doi.org/10.1117/1.jmm.21.4.041605 -
4
المؤلفون: Yu Zhang, David Wei Zhang, Yuyang Bian, Biqiu Liu, Cong Zhang, Jun Huang
المصدر: Journal of Micro/Nanopatterning, Materials, and Metrology. 21
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::9d1bec03eadbb15ff48111f3df00aab4
https://doi.org/10.1117/1.jmm.21.3.034001 -
5
المؤلفون: Yuyang Bian, Biqiu Liu, Xijun Guan, Xiaobo Guo, Cong Zhang, Wenzhan Zhou, Jun Huang, Yu Zhang, Jiawang Song, Yang Gao, Shmuel Nissim, Kevin Houchens, Omri Baum, Qiang Zhou, Zaisan Yang, Amit Zakay, Tal Ayzik, Yaniv Abramovitz
المصدر: Metrology, Inspection, and Process Control XXXVI.
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::a5cda6b86bb61fe7eb7eee181d776b72
https://doi.org/10.1117/12.2614221 -
6
المؤلفون: Xue Liu, Yuyang Bian, Weixing Zhou, Chuanwei Wu, Zhenjian Jia
المصدر: International Journal of Heat and Mass Transfer. 200:123507
مصطلحات موضوعية: Fluid Flow and Transfer Processes, Mechanical Engineering, Condensed Matter Physics
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7
المؤلفون: Kan Zhou, Xin Guo, Yuyang Bian, Wenzhan Zhou, Yu Zhang, Ijen van Mil, Elly Shi, Robbin Zhu, Jo Zhu, Ivan Mao, Elvira Koolen, Kaiyuan Chi, Jose Carlos Font Trinchant, Gratiela Isai, Selena Chen, Jing Wang, Pei Wang, Shane Su, Xuechen Zhu, Kolos Lin, Kelvin Pao, Koen Thuijs, Peja Lee, Abdalmohsen Elmalk, Sudharshanan Raghunathan, Andy Zhang, Leon Liang, Xander Wang, Gary Zhang
المصدر: 2021 International Workshop on Advanced Patterning Solutions (IWAPS).
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::72f72295ee02e96ab1c0f80e10d684ae
https://doi.org/10.1109/iwaps54037.2021.9671240 -
8
المؤلفون: Yuyang Bian, Xijun Guan, Biqiu Liu, Xiaobo Guo, Cong Zhang, Wenzhan Zhou, Jun Huang, Yu Zhang, Lingyi Guo, Faquan Liu, Jinyan Song, Chunfei Sui
المصدر: 2021 International Workshop on Advanced Patterning Solutions (IWAPS).
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::86d68e7a03d1f90d926b5baa45ea0ce4
https://doi.org/10.1109/iwaps54037.2021.9671066 -
9
المؤلفون: Yu Zhang, Yuyang Bian, Yaniv Abramovitz, Yifei Zhu, Omri Baum, Alexander Vipolzov, Qiang Zhou, Biqiu Liu, Song Gao, Shmuel Ben Nissim, Cong Zhang, Uri Smolyan, Jun Huang, Xiaobo Guo
المصدر: Metrology, Inspection, and Process Control for Semiconductor Manufacturing XXXV.
مصطلحات موضوعية: Accuracy and precision, Sampling (signal processing), Computer science, Line (geometry), Electronic engineering, Process (computing), Node (circuits), Overlay, Critical dimension, Die (integrated circuit)
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::d7038abbb89ac80e8855e45f742b2d35
https://doi.org/10.1117/12.2585391 -
10
المؤلفون: Xijun Guan, Xiaobo Guo, Yujie Xu, Cong Zhang, Yuyang Bian, Biqiu Liu, Dandan Hu, Song Gao, Yu Zhang, Lulu Lai, Jun Huang, Yongyu Yuan
المصدر: Metrology, Inspection, and Process Control for Semiconductor Manufacturing XXXV.
مصطلحات موضوعية: Optics, Materials science, Resist, Scanning electron microscope, business.industry, Cathode ray, Spectral density, Surface finish, Edge (geometry), business, Lithography, Noise (electronics)
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::3a130d25421b3b26293325f828e6075e
https://doi.org/10.1117/12.2583545