المؤلفون: Kumar, Rahul, Dubey, P. K., Zafer, Afaqul, Kumar, Ashok, Yadav, Sanjay

المصدر: IEEE Instrumentation & Measurement Magazine IEEE Instrum. Meas. Mag. Instrumentation & Measurement Magazine, IEEE. 27(3):68-73 May, 2024

المؤلفون: Kumar, Rahul^{Aff1, Aff2, IDs40032023010197_cor1}, Yadav, Kalpana^{Aff1, Aff2}, Dubey, P. K.^{Aff1, Aff2}, Zafer, Afaqul^{Aff1, Aff2}, Kumar, Ashok^{Aff1, Aff2}, Yadav, Sanjay^{Aff1, Aff2}

المصدر: Journal of The Institution of Engineers (India): Series C: Mechanical, Production, Aerospace and Marine Engineering. 105(1):31-39

المؤلفون: Rab, Shanay^{Aff1, IDs12647023006411_cor1}, Wan, Meher, Sharma, Raman Kumar, Kumar, Lalit, Zafer, Afaqul, Saeed, Khizer, Yadav, Sanjay

المصدر: MAPAN: Journal of Metrology Society of India. :1-8

المؤلفون: Rigosi, Albert F.^Aff6, Kruskopf, Mattias^Aff7, Panna, Alireza R.^Aff6, Payagala, Shamith U.^Aff6, Jarrett, Dean G.^Aff6, Elmquist, Randolph E.^Aff6, Newell, David B.^Aff6, Zafer, Afaqul, Section editor^Aff8, Rab, Shanay, Section editor^Aff9, Wan, Meher, Section editor^Aff10, Yadav, Sanjay, Section editor^Aff11

المساهمون: Aswal, Dinesh K., editor^Aff1, Yadav, Sanjay, editor^Aff2, Takatsuji, Toshiyuki, editor^Aff3, Rachakonda, Prem, editor^Aff4, Kumar, Harish, editor^Aff5

المصدر: Handbook of Metrology and Applications. :329-361

Degree: M.Tech
PhD

المؤلفون: Thakur, Vikas N.^Aff6, Yadav, Sanjay^{Aff7, Aff12}, Kumar, Ashok^Aff8, Zafer, Afaqul, Section editor^Aff9, Rab, Shanay, Section editor^Aff10, Wan, Meher, Section editor^Aff11

المساهمون: Aswal, Dinesh K., editor^Aff1, Yadav, Sanjay, editor^Aff2, Takatsuji, Toshiyuki, editor^Aff3, Rachakonda, Prem, editor^Aff4, Kumar, Harish, editor^Aff5

المصدر: Handbook of Metrology and Applications. :363-400

Degree: M.Tech
PhD

المؤلفون: Kuramoto, Naoki^Aff6, Zafer, Afaqul, Section editor^Aff7, Rab, Shanay, Section editor^Aff8, Wan, Meher, Section editor^Aff9, Yadav, Sanjay, Section editor^{Aff10, Aff11}

المساهمون: Aswal, Dinesh K., editor^Aff1, Yadav, Sanjay, editor^Aff2, Takatsuji, Toshiyuki, editor^Aff3, Rachakonda, Prem, editor^Aff4, Kumar, Harish, editor^Aff5

المصدر: Handbook of Metrology and Applications. :167-188

Degree: M.Tech
PhD

المؤلفون: Babita^{Aff6, Aff7}, Pant, Umesh^Aff6, Shivagan, D. D.^{Aff6, Aff7}, Zafer, Afaqul, Section editor^Aff8, Rab, Shanay, Section editor^Aff9, Wan, Meher, Section editor^Aff10, Yadav, Sanjay, Section editor^{Aff11, Aff12}

المساهمون: Aswal, Dinesh K., editor^Aff1, Yadav, Sanjay, editor^Aff2, Takatsuji, Toshiyuki, editor^Aff3, Rachakonda, Prem, editor^Aff4, Kumar, Harish, editor^Aff5

المصدر: Handbook of Metrology and Applications. :235-268

Degree: M.Tech
PhD

المؤلفون: Jewariya, Mukesh^Aff6, Zafer, Afaqul, Section editor^Aff7, Rab, Shanay, Section editor^Aff8, Wan, Meher, Section editor^Aff9, Yadav, Sanjay, Section editor^Aff10

المساهمون: Aswal, Dinesh K., editor^Aff1, Yadav, Sanjay, editor^Aff2, Takatsuji, Toshiyuki, editor^Aff3, Rachakonda, Prem, editor^Aff4, Kumar, Harish, editor^Aff5

المصدر: Handbook of Metrology and Applications. :219-234

Degree: M.Tech
PhD

المؤلفون: Ehtesham, Bushra^{Aff6, Aff7}, John, Thomas^Aff6, Singh, H. K.^{Aff6, Aff7}, Singh, Nidhi^{Aff6, Aff7}, Zafer, Afaqul, Section editor^Aff8, Rab, Shanay, Section editor^Aff9, Wan, Meher, Section editor^Aff10, Yadav, Sanjay, Section editor^Aff11

المساهمون: Aswal, Dinesh K., editor^Aff1, Yadav, Sanjay, editor^Aff2, Takatsuji, Toshiyuki, editor^Aff3, Rachakonda, Prem, editor^Aff4, Kumar, Harish, editor^Aff5

المصدر: Handbook of Metrology and Applications. :189-218

Degree: M.Tech
PhD

المؤلفون: Pramann, Axel^Aff6, Rienitz, Olaf^Aff6, Güttler, Bernd^Aff6, Zafer, Afaqul, Section editor^Aff7, Rab, Shanay, Section editor^Aff8, Wan, Meher, Section editor^Aff9, Yadav, Sanjay, Section editor^Aff10

المساهمون: Aswal, Dinesh K., editor^Aff1, Yadav, Sanjay, editor^Aff2, Takatsuji, Toshiyuki, editor^Aff3, Rachakonda, Prem, editor^Aff4, Kumar, Harish, editor^Aff5

المصدر: Handbook of Metrology and Applications. :299-328

Degree: M.Tech
PhD