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1مؤتمر
المؤلفون: Anithambigai, P., Mutharasu, D., Zahner, T., Huong, L. H., Lacey, D.
المصدر: 20th International Workshop on Thermal Investigations of ICs and Systems Thermal Investigations of ICs and Systems (THERMINIC), 2014 20th International Workshop on. :1-6 Sep, 2014
Relation: 2014 20th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC)
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2مؤتمر
المؤلفون: Anithambigai, P., Shanmugan, S., Mutharasu, D., Zahner, T., Lacey, D.
المصدر: 19th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC) Thermal Investigations of ICs and Systems (THERMINIC), 2013 19th International Workshop on. :181-187 Sep, 2013
Relation: 2013 19th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC)
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3تقرير
المؤلفون: Zahner, T., Lochbühler, T., Mariethoz, G., Linde, N.
المصدر: Geophysical Journal International, 204, 1179-1190 (2016)
مصطلحات موضوعية: Physics - Geophysics
URL الوصول: http://arxiv.org/abs/1701.01593
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4دورية أكاديمية
المؤلفون: Meneghini, M., Trevisanello, L.-R., Zehnder, U., Zahner, T., Strauss, U., Meneghesso, G., Zanoni, E.
المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 53(12):2981-2987 Dec, 2006
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5مؤتمر
المؤلفون: Meneghini, M., Trevisanello, L.R., Levada, S., Meneghesso, G., Tamiazzo, G., Zanoni, E., Zahner, T., Zehnder, U., Harle, V., Straus, U.
المصدر: IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. International Electron Devices Meeting 2005 Electron Devices Meeting, 2005. IEDM Technical Digest. IEEE International. :4 pp.-1012 2005
Relation: International Electron Devices Meeting 2005
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6دورية أكاديمية
المؤلفون: Anithambigai, P., Shanmugan, S., Mutharasu, D., Zahner, T., Lacey, D.
المصدر: In Microelectronics Journal December 2014 45(12):1726-1733
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7دورية أكاديمية
المؤلفون: Anithambigai, P., Mutharasu, D., Huong, L. H., Zahner, T., Lacey, D.
المصدر: Journal of Materials Science: Materials in Electronics. November 2014 25(11):4814-4821
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8دورية أكاديمية
المؤلفون: Castaldini, A., Cavallini, A., Rigutti, L., Meneghini, M., Levada, S., Meneghesso, G., Zanoni, E., Härle, V., Zahner, T., Zehnder, U.
المصدر: MRS Online Proceedings Library. 892(1)
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9دورية أكاديمية
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10
المؤلفون: Meneghini, Matteo, Trevisanello, LORENZO ROBERTO, Zahner, T., Zehnder, U., Strauss, U., Meneghesso, Gaudenzio, Zanoni, Enrico
مصطلحات موضوعية: reliability, light emitting diodes, InGaN, degradation
URL الوصول: https://explore.openaire.eu/search/publication?articleId=od______3657::2cde4492d213ecd4c9f59bde985bcde8
http://hdl.handle.net/11577/2429689
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