يعرض 1 - 10 نتائج من 348 نتيجة بحث عن '"Zambelli C"', وقت الاستعلام: 0.91s تنقيح النتائج
  1. 1
    دورية أكاديمية
    Process-Voltage-Temperature Variations Assessment in Energy-Aware Resistive RAM-Based FPGAs

    المؤلفون: Rizzi, T., Baroni, A., Glukhov, A., Bertozzi, D., Wenger, C., Ielmini, D., Zambelli, C.

    المصدر: IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 23(3):328-336 Sep, 2023

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  2. 2
    دورية أكاديمية
    An HPC Pipeline for Calcium Quantification of Aortic Root From Contrast-Enhanced CCT Scans

    المؤلفون: Minghini, G., Cavallo, A.U., Miola, A., Sisini, V., Calore, E., Fortini, F., Micheloni, R., Rizzo, P., Schifano, S.F., Sega, F.V.D., Zambelli, C.

    المصدر: IEEE Access Access, IEEE. 11:101309-101319 2023

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  3. 3
    دورية أكاديمية
    Low Conductance State Drift Characterization and Mitigation in Resistive Switching Memories (RRAM) for Artificial Neural Networks

    المؤلفون: Baroni, A., Glukhov, A., Perez, E., Wenger, C., Ielmini, D., Olivo, P., Zambelli, C.

    المصدر: IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 22(3):340-347 Sep, 2022

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  4. 4
    مؤتمر
    Comparative Analysis and Optimization of the SystemC-AMS Analog Simulation Efficiency of Resistive Crossbar Arrays

    المؤلفون: Rizzi, T., Quesada, E. Perez-Bosch, Wenger, Ch., Zambelli, C., Bertozzi, D.

    المصدر: 2021 XXXVI Conference on Design of Circuits and Integrated Systems (DCIS) Design of Circuits and Integrated Systems (DCIS), 2021 XXXVI Conference on. :1-6 Nov, 2021

    Relation: 2021 XXXVI Conference on Design of Circuits and Integrated Systems (DCIS)

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  5. 5
    دورية أكاديمية
    In-Memory Principal Component Analysis by Crosspoint Array of Resistive Switching Memory: A new hardware approach for energy-efficient data analysis in edge computing

    المؤلفون: Mannocci, P., Baroni, A., Melacarne, E., Zambelli, C., Olivo, P., Perez, E., Wenger, C., Ielmini, D.

    المصدر: IEEE Nanotechnology Magazine IEEE Nanotechnology Mag. Nanotechnology Magazine, IEEE. 16(2):4-13 Apr, 2022

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  6. 6
    دورية أكاديمية
    Investigating 3D NAND Flash Read Disturb Reliability With Extreme Value Analysis

    المؤلفون: Zambelli, C., Crippa, L., Micheloni, R., Olivo, P.

    المصدر: IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 21(4):486-493 Dec, 2021

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  7. 7
    دورية أكاديمية
    Accurate Program/Verify Schemes of Resistive Switching Memory (RRAM) for In-Memory Neural Network Circuits

    المؤلفون: Milo, V., Glukhov, A., Perez, E., Zambelli, C., Lepri, N., Mahadevaiah, M.K., Quesada, E.P., Olivo, P., Wenger, C., Ielmini, D.

    المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 68(8):3832-3837 Aug, 2021

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  8. 8
    دورية أكاديمية
    Reliability of Logic-in-Memory Circuits in Resistive Memory Arrays

    المؤلفون: Zanotti, T., Zambelli, C., Puglisi, F.M., Milo, V., Perez, E., Mahadevaiah, M.K., Ossorio, O.G., Wenger, C., Pavan, P., Olivo, P., Ielmini, D.

    المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 67(11):4611-4615 Nov, 2020

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  9. 9
    مؤتمر
    Low-energy inference machine with multilevel HfO2 RRAM arrays

    المؤلفون: Milo, V., Zambelli, C., Olivo, P., Perez, E., Ossorio, O. G., Wenger, Ch., Ielmini, D.

    المصدر: ESSDERC 2019 - 49th European Solid-State Device Research Conference (ESSDERC) Solid-State Device Research Conference (ESSDERC), 2019 49th European. :174-177 Sep, 2019

    Relation: ESSDERC 2019 - 49th European Solid-State Device Research Conference (ESSDERC)

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  10. 10
    مؤتمر
    Reliability of CMOS Integrated Memristive HfO2 Arrays with Respect to Neuromorphic Computing

    المؤلفون: Mahadevaiah, M.K., Perez, E., Wenger, Ch., Grossi, A., Zambelli, C., Olivo, P., Zahari, F., Kohlstedt, H., Ziegler, M.

    المصدر: 2019 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2019 IEEE International. :1-4 Mar, 2019

    Relation: 2019 IEEE International Reliability Physics Symposium (IRPS)

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