يعرض 1 - 10 نتائج من 51 نتيجة بحث عن '"Zanotti, Tommaso"', وقت الاستعلام: 0.88s تنقيح النتائج
  1. 1
    مؤتمر
    Reliability Analysis of Random Telegraph Noisebased True Random Number Generators

    المؤلفون: Zanotti, Tommaso, Ranjan, Alok, O'Shea, Sean J., Raghavan, Nagarajan, Thamankar, Ramesh, Pey, Kin Leong, Maria Puglisi, Francesco

    المصدر: 2023 IEEE International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2023 IEEE International. :1-6 Oct, 2023

    Relation: 2023 IEEE International Integrated Reliability Workshop (IIRW)

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  2. 2
    مؤتمر
    Self-consistent Automated Parameter Extraction of RRAM Physics-Based Compact Model

    المؤلفون: Zanotti, Tommaso, Pavan, Paolo, Puglisi, Francesco Maria

    المصدر: ESSDERC 2022 - IEEE 52nd European Solid-State Device Research Conference (ESSDERC) Solid-State Device Research Conference (ESSDERC), ESSDERC 2022 - IEEE 52nd European. :316-319 Sep, 2022

    Relation: ESSDERC 2022 - IEEE 52nd European Solid-State Device Research Conference (ESSDERC)

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  3. 3
    مؤتمر
    Performances and Trade-offs of Low-Bit Precision Neural Networks based on Resistive Memories

    المؤلفون: Zanotti, Tommaso, Pavan, Paolo, Puglisi, Francesco Maria

    المصدر: 2021 IEEE International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2021 IEEE International. :1-5 Oct, 2021

    Relation: 2021 IEEE International Integrated Reliability Workshop (IIRW)

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  4. 4
    مؤتمر
    Reliability and Prospects of Logic-in-Memory Circuits

    المؤلفون: Zanotti, Tommaso

    المصدر: 2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) Electron Devices Technology & Manufacturing Conference (EDTM), 2022 6th IEEE. :369-371 Mar, 2022

    Relation: 2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)

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  5. 5
    مؤتمر
    Low-Bit Precision Neural Network Architecture with High Immunity to Variability and Random Telegraph Noise based on Resistive Memories

    المؤلفون: Zanotti, Tommaso, Puglisi, Francesco Maria, Pavan, Paolo

    المصدر: 2021 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2021 IEEE International. :1-6 Mar, 2021

    Relation: 2021 IEEE International Reliability Physics Symposium (IRPS)

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  6. 6
    تقرير
    Smart Material Implication Using Spin-Transfer Torque Magnetic Tunnel Junctions for Logic-in-Memory Computing

    المؤلفون: De Rose, Raffaele, Zanotti, Tommaso, Puglisi, Francesco Maria, Crupi, Felice, Pavan, Paolo, Lanuzza, Marco

    المصدر: Solid-State Electronics 2022

    مصطلحات موضوعية: Computer Science - Emerging Technologies, Physics - Applied Physics

    URL الوصول: http://arxiv.org/abs/2205.09388

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  7. 7
    مؤتمر
    Circuit Reliability Analysis of In-Memory Inference in Binarized Neural Networks

    المؤلفون: Zanotti, Tommaso, Puglisi, Francesco Maria, Pavan, Paolo

    المصدر: 2020 IEEE International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2020 IEEE International. :1-5 Oct, 2020

    Relation: 2020 IEEE International Integrated Reliability Workshop (IIRW)

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  8. 8
    مؤتمر
    Smart Logic-in-Memory Architecture For Ultra-Low Power Large Fan-In Operations

    المؤلفون: Zanotti, Tommaso, Puglisi, Francesco Maria, Pavan, Paolo

    المصدر: 2020 2nd IEEE International Conference on Artificial Intelligence Circuits and Systems (AICAS) Artificial Intelligence Circuits and Systems (AICAS), 2020 2nd IEEE International Conference on. :31-35 Aug, 2020

    Relation: 2020 2nd IEEE International Conference on Artificial Intelligence Circuits and Systems (AICAS)

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  9. 9
    مؤتمر
    Circuit Reliability Analysis of RRAM-based Logic-in-Memory Crossbar Architectures Including Line Parasitic Effects, Variability, and Random Telegraph Noise

    المؤلفون: Zanotti, Tommaso, Puglisi, Francesco Maria, Pavan, Paolo

    المصدر: 2020 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2020 IEEE International. :1-5 Apr, 2020

    Relation: 2020 IEEE International Reliability Physics Symposium (IRPS)

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  10. 10
    مؤتمر
    Circuit Reliability of Low-Power RRAM-Based Logic-in-Memory Architectures

    المؤلفون: Zanotti, Tommaso, Puglisi, Francesco Maria, Pavan, Paolo

    المصدر: 2019 IEEE International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2019 IEEE International. :1-5 Oct, 2019

    Relation: 2019 IEEE International Integrated Reliability Workshop (IIRW)

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