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المؤلفون: Qais Saadeh, Philipp Naujok, Devesh Thakare, Meiyi Wu, Vicky Philipsen, Frank Scholze, Christian Buchholz, Zanyar Salami, Yasser Abdulhadi, Danilo Ocaña García, Heiko Mentzel, Anja Babuschkin, Christian Laubis, Victor Soltwisch
المصدر: Optik. 273:170455
مصطلحات موضوعية: Science & Technology, INFORMATION, Thin films, MIRRORS, Optics, Cobalt, X-ray reflectivity, FREQUENCY-ANALYSIS, Carbon, Atomic and Molecular Physics, and Optics, REFLECTOMETRY, Electronic, Optical and Magnetic Materials, Extreme ultraviolet, THIN-FILMS, Physical Sciences, Optical constants, SCATTERING, WAVELET-TRANSFORM, Electrical and Electronic Engineering, EXTREME-ULTRAVIOLET, OPTIMIZATION
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المصدر: Modeling Aspects in Optical Metrology VIII.
مصطلحات موضوعية: Materials science, Optics, business.industry, Microelectronics, X-ray fluorescence, Lamellar structure, Surface finish, Edge (geometry), business, Intensity (heat transfer), Metrology, Line (formation)
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::97a32298ea36c5b7a666d6ff6588c2a6
https://doi.org/10.1117/12.2592611