المؤلفون: Zenari, M., Buffolo, M., De Santi, C., Goyvaerts, J., Grabowski, A., Gustavsson, J., Baets, R., Larsson, A., Roelkens, G., Meneghesso, G., Zanoni, E., Meneghini, M.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(2):1131-1138 Feb, 2024

المؤلفون: Zenari, M., Gioannini, M., Buffolo, M., Tibaldi, A., De Santi, C., Norman, J., Shang, C., Dumont, M., Bowers, J.E., Herrick, R.W., Meneghesso, G., Zanoni, E., Meneghini, M.

المصدر: IEEE Journal of Selected Topics in Quantum Electronics IEEE J. Select. Topics Quantum Electron. Selected Topics in Quantum Electronics, IEEE Journal of. 31(2: Pwr. and Effic. Scaling in Semiconductor Lasers):1-8 Apr, 2025

المؤلفون: Zenari, M., Buffolo, M., Rampazzo, F., De Santi, C., Rossi, F., Lazzarini, L., Goyvaerts, J., Grabowski, A., Gustavsson, J.S., Baets, R., Larsson, A., Roelkens, G., Meneghesso, G., Zanoni, E., Meneghini, M.

المصدر: IEEE Journal of Selected Topics in Quantum Electronics IEEE J. Select. Topics Quantum Electron. Selected Topics in Quantum Electronics, IEEE Journal of. 31(2: Pwr. and Effic. Scaling in Semiconductor Lasers):1-9 Apr, 2025

المؤلفون: Zenari, M., Buffolo, M., Fornasier, M., De Santi, C., Goyvaerts, J., Grabowski, A., Gustavsson, J., Kumari, S., Stassren, A., Baets, R., Larsson, A., Roelkens, G., Meneghesso, G., Zanoni, E., Meneghini, M.

المصدر: IEEE Journal of Quantum Electronics IEEE J. Quantum Electron. Quantum Electronics, IEEE Journal of. 59(4):1-10 Aug, 2023

المؤلفون: Zenari, M., Buffolo, M., De Santi, C., Goyvaerts, J., Grabowski, A., Gustavsson, J., Baets, R., Larsson, A., Roelkens, G., Meneghesso, G., Zanoni, E., Meneghini, M.

المصدر: 2023 International Conference on Numerical Simulation of Optoelectronic Devices (NUSOD) Numerical Simulation of Optoelectronic Devices (NUSOD), 2023 International Conference on. :91-92 Sep, 2023

Relation: 2023 International Conference on Numerical Simulation of Optoelectronic Devices (NUSOD)

المؤلفون: Buffolo, M., Zenari, M., Fornasier, M., De Santi, C., Goyvaerts, J., Grabowski, A., Gustavsson, J., Kumari, S., Stassen, A., Morthier, Geert, Baets, R., Larsson, A., Roelkens, G., Meneghesso, G., Zanoni, E., Meneghini, M.

المصدر: 2023 Conference on Lasers and Electro-Optics (CLEO) Lasers and Electro-Optics (CLEO), 2023 Conference on. :1-2 May, 2023

Relation: 2023 Conference on Lasers and Electro-Optics (CLEO)

المؤلفون: Buffolo, M., Lain, F., Zenari, M., Santi, C.D., Norman, J., Bowers, J.E., Herrick, R.W., Meneghesso, G., Zanoni, E., Meneghini, M.

المصدر: IEEE Journal of Selected Topics in Quantum Electronics IEEE J. Select. Topics Quantum Electron. Selected Topics in Quantum Electronics, IEEE Journal of. 28(1: Semiconductor Lasers):1-9 Jan, 2022

المؤلفون: Zenari, M., Buffolo, M., Fornasier, M., De Santi, C., Goyvaerts, J., Grabowski, Alexander, 1993, Gustavsson, Johan, 1974, Kumari, Sulakshna, Stassren, A., Baets, Roel G., Larsson, Anders, 1957, Roelkens, Gunther, Meneghesso, G., Zanoni, E., Meneghini, M.

المصدر: Vertical-Cavity Surface-Emitting Lasers XXVII 2023, San Francisco, USA Proceedings of SPIE - The International Society for Optical Engineering. 12439

مصطلحات موضوعية: VCSIL, Degradation, Diffusion, PICs

وصف الملف: electronic

URL الوصول: https://research.chalmers.se/publication/535978
https://research.chalmers.se/publication/535978/file/535978_Fulltext.pdf

المؤلفون: Zenari, M., Buffolo, M., De Santi, C., Shang, C., Hughes, E., Wan, Y., Herrick, R.W., Meneghesso, G., Zanoni, E., Bowers, J., Meneghini, M.

المصدر: In Microelectronics Reliability November 2022 138

المؤلفون: Zenari, M., Buffolo, M., De Santi, C., Norman, J., Herrick, R.W., Meneghesso, G., Zanoni, E., Bowers, J., Meneghini, M.

المصدر: In Microelectronics Reliability November 2021 126