المؤلفون: Ngom, C., Pouget, V., Zerarka, M., Coccetti, F., Touboul, A., Matmat, M., Crepel, O.

المصدر: 2021 21th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Radiation and Its Effects on Components and Systems (RADECS), 2021 21th European Conference. :1-6 Sep, 2021

Relation: 2021 21th European Conference on Radiation and Its Effects on Components and Systems (RADECS)

المؤلفون: Zerarka, M., Crepel, O., Weulersse, C., Morand, S., Binois, C., Mazurek, M., Vignon, G., Serrano, L., Coccetti, F.

المصدر: 2020 20th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Radiation and Its Effects on Components and Systems (RADECS), 2020 20th European Conference on. :1-5 Oct, 2020

Relation: 2020 20th European Conference on Radiation and Its Effects on Components and Systems (RADECS)

المؤلفون: Ngom, C., Pouget, V., Zerarka, M., Coccetti, F., Touboul, A., Matmat, M., Crepel, O., Jonathas, S., Bascoul, G.

المصدر: IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 68(8):1642-1650 Aug, 2021

المؤلفون: Zerarka, M., Rustichelli, V., Perrotin, O., Reynes, J.M., Tremouilles, D., Azzopardi, S., Serre, A., Bergeret, F., Allirand, L., Coccetti, F.

المصدر: In Microelectronics Reliability November 2023 150

المؤلفون: Zerarka, M., Austin, P., Bensoussan, A., Morancho, F., Durier, A.

المصدر: 2016 16th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Radiation and Its Effects on Components and Systems (RADECS), 2016 16th European Conference on. :1-4 Sep, 2016

Relation: 2016 16th European Conference on Radiation and Its Effects on Components and Systems (RADECS)

المؤلفون: Ngom, C., Pouget, V., Zerarka, M., Coccetti, F., Crepel, O., Touboul, A., Matmat, M.

المصدر: In Microelectronics Reliability November 2021 126

المؤلفون: Zerarka, M., Austin, P., Bafleur, M.

المصدر: CAS 2011 Proceedings (2011 International Semiconductor Conference) Semiconductor Conference (CAS), 2011 International. 2:305-308 Oct, 2011

Relation: 2011 International Semiconductor Conference (CAS 2011)

المؤلفون: Arbess, H., Bafleur, M., Tremouilles, D., Zerarka, M.

المصدر: IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 14(1):432-440 Mar, 2014

المؤلفون: Zerarka, M., Austin, P., Toulon, G., Morancho, F., Arbess, H., Tasselli, J.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 59(12):3482-3488 Dec, 2012

المؤلفون: Zerarka, M., Austin, P., Bensoussan, A., Morancho, F., Durier, A.

المصدر: IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 64(8):2242-2249 Aug, 2017