المؤلفون: Park, Henry, Abdullatif, Mohammed, Chen, Ehung, Elmallah, Ahmed, Nehal, Qaiser, Gandara, Miguel, Liu, Tsz-Bin, Khashaba, Amr, Lee, Joonyeong, Kuan, Chih-Yi, Hamachandran, Dhinessh, Sun, Ruey-Bo, Atharav, Atharav, Chun, Yusang, Zhang, Mantian, Weng, Deng-Fu, Tsai, Chung-Hsien, Chang, Chen-Hao, Peng, Chia-Sheng, Hsu, Sheng-Tsung, Ali, Tamer

المصدر: 2023 IEEE International Solid-State Circuits Conference (ISSCC) Solid-State Circuits Conference (ISSCC), 2023 IEEE International. :5-7 Feb, 2023

Relation: 2023 IEEE International Solid-State Circuits Conference (ISSCC)

المؤلفون: Xiong, Zhonghua, Zhao, Lei^{Aff2, Aff3}, Mei, Yanliang, Qiu, Dong, Li, Xiaoshuang, Zhang, Peng, Zhang, Mantian, Cao, Jin^{Aff4, IDs10194024018539_cor8}, Wang, Yonggang^{Aff1, IDs10194024018539_cor9}

المصدر: The Journal of Headache and Pain: Official Journal of the "European Headache Federation" and of "Lifting The Burden - The Global Campaign against Headache". 25(1)

المؤلفون: Li, Zhilei, Mei, Yanliang, Wang, Wei, Wang, Lei, Wu, Shouyi, Zhang, Kaibo, Qiu, Dong, Xiong, Zhonghua, Li, Xiaoshuang, Yuan, Ziyu, Zhang, Peng, Zhang, Mantian, Tong, Qiuling, Zhang, Zhenchang^{Aff1, IDs10194024018151_cor14}, Wang, Yonggang^{Aff1, Aff2, IDs10194024018151_cor15}

المصدر: The Journal of Headache and Pain: Official Journal of the "European Headache Federation" and of "Lifting The Burden - The Global Campaign against Headache". 25(1)

المؤلفون: Qiu, Dong, Ge, Zhaoli, Mei, Yanliang, Wang, Wei, Xiong, Zhonghua, Li, Xiaoshuang, Yuan, Ziyu, Zhang, Peng, Zhang, Mantian, Liu, Xin, Zhang, Yaqing, Yu, Xueying, Tang, Hefei, Wang, Yonggang^{Aff1, IDs1019402301695x_cor14}

المصدر: The Journal of Headache and Pain: Official Journal of the "European Headache Federation" and of "Lifting The Burden - The Global Campaign against Headache". 24(1)

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المؤلفون: Zhang, Mantian

مصطلحات موضوعية: PVT-robust, Dynamic amplifier, Hardware_INTEGRATEDCIRCUITS, Hardware_PERFORMANCEANDRELIABILITY, High-linearity

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::6f8b0300f7fad7d3fa6473b9e4860206