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1مؤتمر
المؤلفون: Zhang, Zhengxuan, Mai, Weixing, Xiong, Haoliang, Wu, Chuhan, Xue, Yun
المصدر: 2023 IEEE International Conference on Multimedia and Expo (ICME) ICME Multimedia and Expo (ICME), 2023 IEEE International Conference on. :2153-2158 Jul, 2023
Relation: 2023 IEEE International Conference on Multimedia and Expo (ICME)
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2مؤتمر
المؤلفون: Huang, Jiangyang, Zhang, Zhengxuan, Yang, Xu, Tu, Rang
المصدر: 2023 IEEE 12th Data Driven Control and Learning Systems Conference (DDCLS) Data Driven Control and Learning Systems Conference (DDCLS), 2023 IEEE 12th. :962-967 May, 2023
Relation: 2023 IEEE 12th Data Driven Control and Learning Systems Conference (DDCLS)
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3دورية أكاديمية
المؤلفون: Zhang, Zhengxuan, Chen, Jianying, Liu, Xuejie, Mai, Weixing, Cai, QianhuaAff1, IDs13042023020378_cor5
المصدر: International Journal of Machine Learning and Cybernetics. 15(6):2399-2409
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4دورية أكاديمية
المؤلفون: Mai, Weixing, Zhang, Zhengxuan, Chen, Yifan, Li, Kuntao, Xue, Yun
المصدر: In Knowledge-Based Systems 9 October 2024 301
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5دورية أكاديمية
المؤلفون: Chen, Jianying, Xue, YunAff4, IDs1304202201754w_cor2, Zhang, Haolan, Ding, Weiping, Zhang, Zhengxuan, Chen, Jiehai
المصدر: International Journal of Machine Learning and Cybernetics. 14(6):2181-2192
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6مؤتمر
المؤلفون: Liu, Xuwang, Zhang, Zhengxuan, Qi, Wei
المصدر: 2018 Chinese Control And Decision Conference (CCDC) Chinese Control And Decision Conference (CCDC), 2018. :1766-1771 Jun, 2018
Relation: 2018 Chinese Control And Decision Conference (CCDC)
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7مؤتمر
المؤلفون: Lin, Dianpeng, Zhang, Zhengxuan, Xu, Yiran, Xie, Xin, Jiang, Jianwei, Ren, Jiangchuan, Zhu, Huilong
المصدر: 2018 International Conference on Radiation Effects of Electronic Devices (ICREED) Radiation Effects of Electronic Devices (ICREED), 2018 International Conference on. :1-4 May, 2018
Relation: 2018 International Conference on Radiation Effects of Electronic Devices (ICREED)
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8دورية أكاديمية
لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل. -
9دورية أكاديمية
المؤلفون: Liu, Zhongyang, Zhang, Haineng, Xie, Yuqiao, Bi, Dawei, Hu, Zhiyuan, Zou, Shichang, Zhang, Zhengxuan
المصدر: In Microelectronics Reliability February 2023 141
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10دورية أكاديمية
لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل.