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المؤلفون: Zhao-Chen Gu, Chen-Chien Li, Shih-Han Yi, Yan-Lin Li, Yu-Wei Chang, Tzung-Yu Wu, Jiayi Huang, Po-Yen Chen, Tse-Jung Huang, Fu-Chuan Chu, Kuei-Shu Chang-Liao
المصدر: Microelectronics Reliability. 79:136-139
مصطلحات موضوعية: Materials science, Oxide, Equivalent oxide thickness, 02 engineering and technology, Dielectric, 01 natural sciences, chemistry.chemical_compound, Reliability (semiconductor), 0103 physical sciences, 0202 electrical engineering, electronic engineering, information engineering, Electronic engineering, Electrical and Electronic Engineering, Safety, Risk, Reliability and Quality, 010302 applied physics, business.industry, 020208 electrical & electronic engineering, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Hysteresis, chemistry, Trap density, Optoelectronics, business, Layer (electronics), Voltage