المؤلفون: fan, Xia, Zhi-nong, Yu, Yu-qiong, Li, Zhi-wei, Zhao

المصدر: 2008 Asia Optical Fiber Communication & Optoelectronic Exposition & Conference Optical Fiber Communication & Optoelectronic Exposition & Conference, 2008. AOE 2008. Asia. :1-3 Oct, 2008

Relation: 2008 Asia Optical Fiber Communication & Optoelectronic Exposition & Conference (AOE)

المؤلفون: Zhi-nong, Yu, fan, Xia, Yu-qiong, Li, Wei, Xue

المصدر: 2008 Asia Optical Fiber Communication & Optoelectronic Exposition & Conference Optical Fiber Communication & Optoelectronic Exposition & Conference, 2008. AOE 2008. Asia. :1-3 Oct, 2008

Relation: 2008 Asia Optical Fiber Communication & Optoelectronic Exposition & Conference (AOE)

المؤلفون: Qi Li, Meng Li, Xing Zhang, Dedong Han, Zhi-Nong Yu, Junchen Dong, Yi Wang

المصدر: 2020 IEEE 15th International Conference on Solid-State & Integrated Circuit Technology (ICSICT).

مصطلحات موضوعية: Materials science, Thin-film transistor, business.industry, Sputtering, Logic gate, Gate dielectric, Optoelectronics, Dielectric, business, Saturation (magnetic), Stoichiometry, Hafnium oxide

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::af62c07045254c4efa9899e548dc8d6f
https://doi.org/10.1109/icsict49897.2020.9278130

المؤلفون: Zhi-Nong Yu, De-Xiu Zheng, Jong-Wook Seo, Jian Sun

المصدر: Surface and Coatings Technology. :398-404

مصطلحات موضوعية: Argon, Materials science, Ion plating, Analytical chemistry, chemistry.chemical_element, Surfaces and Interfaces, General Chemistry, Condensed Matter Physics, Surfaces, Coatings and Films, Ion, Condensed Matter::Materials Science, Ion beam deposition, chemistry, Physics::Plasma Physics, Condensed Matter::Superconductivity, Physics::Atomic and Molecular Clusters, Materials Chemistry, Thin film, Ion beam-assisted deposition, Layer (electronics), Deposition (law)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::7e0d5407f874f88888e4f13b2db6f28d
https://doi.org/10.1016/s0257-8972(02)00633-3

المؤلفون: De-Xiu Zheng, Soon-Jae Yu, Jian Sun, Zhi-Nong Yu, Jong-Wook Seo

المصدر: Surface and Coatings Technology. 162:11-18

مصطلحات موضوعية: Glow discharge, Materials science, Argon, Analytical chemistry, chemistry.chemical_element, Surfaces and Interfaces, General Chemistry, Partial pressure, Condensed Matter Physics, Evaporation (deposition), Surfaces, Coatings and Films, Ion, chemistry, Materials Chemistry, Thin film, Ion beam-assisted deposition, Layer (electronics)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::e885893b14823880caf029d993fb2200
https://doi.org/10.1016/s0257-8972(02)00580-7

المؤلفون: Dong-Pu, Zhang, Wei, Xue, Zhi-Nong, Yu, Ting, Zhang, Yu-Rong, Jiang, Jian, Leng, Xiang-Jun, Kong

المصدر: Guang pu xue yu guang pu fen xi = Guang pu. 31(2)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=pmid________::dadb011bc90bfe73f15176d8bc3aeb2a
https://pubmed.ncbi.nlm.nih.gov/21510375

المؤلفون: Shi-Yu ZHANG, Zhi-Nong YU, Jin CHENG, De-Long WU, Wei XUE

المصدر: Material Science & Environmental Engineering - the Proceedings of 2016 International Workshop (Iwmsee2016); 2016, p602-609, 8p

مصطلحات موضوعية: HYDROGEN fluoride, THIN film transistors, THIN films, ZINC oxide, SOL-gel materials

المؤلفون: Wei Xue, Zhi-Nong Yu, Jong-Wook Seo, Soon-Jae Yu

المصدر: SPIE Proceedings.

مصطلحات موضوعية: Materials science, business.industry, Annealing (metallurgy), Contact resistance, Doping, Analytical chemistry, Binary compound, Gallium nitride, Temperature measurement, chemistry.chemical_compound, Semiconductor, chemistry, business, Ohmic contact

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::742f3aa11b2b40d8bc25ce2cf71bb55a
https://doi.org/10.1117/12.572520

المؤلفون: Soon-Jae Yu, Zhi-Nong Yu, Jong-Wook Seo, Jian Sun, De-Xiu Zheng

المصدر: SID Symposium Digest of Technical Papers. 33:420

مصطلحات موضوعية: Glow discharge, Ion beam deposition, Materials science, Ion beam, Ion plating, Analytical chemistry, Thin film, Ion beam-assisted deposition, Layer (electronics), Evaporation (deposition)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::5892c1920a02db8b66c36bed30b0cd68
https://doi.org/10.1889/1.1830820

المؤلفون: Xu-Yang Li, Zhi-Nong Yu, Jin Cheng, Yong-Hua Chen, Jian-She Xue, Jian Guo, Wei Xue

المصدر: Chinese Physics B; Apr2018, Vol. 27 Issue 4, p1-1, 1p

مصطلحات موضوعية: INDIUM oxide, METALLIC thin films, THIN film transistors, ANNEALING of metals, ALKOXIDES, THICKNESS measurement