-
1تقرير
المؤلفون: Zhu, Zijian, Zia, Ali, Li, Xuesong, Dan, Bingbing, Ma, Yuebo, Long, Hongfeng, Lu, Kaili, Liu, Enhai, Zhao, Rujin
مصطلحات موضوعية: Computer Science - Computer Vision and Pattern Recognition
URL الوصول: http://arxiv.org/abs/2408.05029
-
2تقرير
-
3تقرير
المؤلفون: Li, Xuesong, Hayder, Zeeshan, Zia, Ali, Cassidy, Connor, Liu, Shiming, Stiller, Warwick, Stone, Eric, Conaty, Warren, Petersson, Lars, Rolland, Vivien
مصطلحات موضوعية: Computer Science - Computer Vision and Pattern Recognition
URL الوصول: http://arxiv.org/abs/2404.11256
-
4مؤتمر
المؤلفون: Pativada, Pranav, Hayder, Zeeshan, Zia, Ali, Barnes, Nick
المصدر: 2023 International Conference on Digital Image Computing: Techniques and Applications (DICTA) DICTA Digital Image Computing: Techniques and Applications (DICTA), 2023 International Conference on. :1-8 Nov, 2023
Relation: 2023 International Conference on Digital Image Computing: Techniques and Applications (DICTA)
-
5مؤتمر
المؤلفون: Sun, Yajie, Zia, Ali, Zhou, Jun
المصدر: 2023 IEEE International Conference on Image Processing (ICIP) Image Processing (ICIP), 2023 IEEE International Conference on. :3354-3358 Oct, 2023
Relation: 2023 IEEE International Conference on Image Processing (ICIP)
-
6مؤتمر
المؤلفون: Saeed, Sadaf, Zia, Ali, Liu, Ri, Liu, Dongdong, Cao, Liang, Wang, Zuobin
المصدر: 2023 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO) Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO), 2023 IEEE International Conference on. :9-12 Jul, 2023
Relation: 2023 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO)
-
7تقرير
المؤلفون: Hajij, Mustafa, Papillon, Mathilde, Frantzen, Florian, Agerberg, Jens, AlJabea, Ibrahem, Ballester, Ruben, Battiloro, Claudio, Bernárdez, Guillermo, Birdal, Tolga, Brent, Aiden, Chin, Peter, Escalera, Sergio, Fiorellino, Simone, Gardaa, Odin Hoff, Gopalakrishnan, Gurusankar, Govil, Devendra, Hoppe, Josef, Karri, Maneel Reddy, Khouja, Jude, Lecha, Manuel, Livesay, Neal, Meißner, Jan, Mukherjee, Soham, Nikitin, Alexander, Papamarkou, Theodore, Prílepok, Jaro, Ramamurthy, Karthikeyan Natesan, Rosen, Paul, Guzmán-Sáenz, Aldo, Salatiello, Alessandro, Samaga, Shreyas N., Scardapane, Simone, Schaub, Michael T., Scofano, Luca, Spinelli, Indro, Telyatnikov, Lev, Truong, Quang, Walters, Robin, Yang, Maosheng, Zaghen, Olga, Zamzmi, Ghada, Zia, Ali, Miolane, Nina
مصطلحات موضوعية: Computer Science - Machine Learning, Computer Science - Artificial Intelligence, Computer Science - Mathematical Software, Statistics - Computation
URL الوصول: http://arxiv.org/abs/2402.02441
-
8تقرير
المؤلفون: Papillon, Mathilde, Hajij, Mustafa, Jenne, Helen, Mathe, Johan, Myers, Audun, Papamarkou, Theodore, Birdal, Tolga, Dey, Tamal, Doster, Tim, Emerson, Tegan, Gopalakrishnan, Gurusankar, Govil, Devendra, Guzmán-Sáenz, Aldo, Kvinge, Henry, Livesay, Neal, Mukherjee, Soham, Samaga, Shreyas N., Ramamurthy, Karthikeyan Natesan, Karri, Maneel Reddy, Rosen, Paul, Sanborn, Sophia, Walters, Robin, Agerberg, Jens, Barikbin, Sadrodin, Battiloro, Claudio, Bazhenov, Gleb, Bernardez, Guillermo, Brent, Aiden, Escalera, Sergio, Fiorellino, Simone, Gavrilev, Dmitrii, Hassanin, Mohammed, Häusner, Paul, Gardaa, Odin Hoff, Khamis, Abdelwahed, Lecha, Manuel, Magai, German, Malygina, Tatiana, Ballester, Rubén, Nadimpalli, Kalyan, Nikitin, Alexander, Rabinowitz, Abraham, Salatiello, Alessandro, Scardapane, Simone, Scofano, Luca, Singh, Suraj, Sjölund, Jens, Snopov, Pavel, Spinelli, Indro, Telyatnikov, Lev, Testa, Lucia, Yang, Maosheng, Yue, Yixiao, Zaghen, Olga, Zia, Ali, Miolane, Nina
مصطلحات موضوعية: Computer Science - Machine Learning
URL الوصول: http://arxiv.org/abs/2309.15188
-
9
-
10مؤتمر
المؤلفون: Saeed, Sadaf, Liu, Ri, Gao, Mingyan, Liu, Dongdong, Wang, Zuobin, Zia, Ali
المصدر: 2022 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO) Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO), 2022 IEEE International Conference on. :568-571 Aug, 2022
Relation: 2022 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO)