المؤلفون: Thompto, Brian W., Nguyen, Dung Q., Moreira, Jose E., Bertran, Ramon, Jacobson, Hans, Eickemeyer, Richard J., Rao, Rahul M., Goulet, Michael, Byers, Marcy, Gonzalez, Christopher J., Swaminathan, Karthik, Dhanwada, Nagu R., Muller, Silvia M., Wagner, Andreas, Sadasivam, Satish Kumar, Montoye, Robert K., Starke, William J., Zoellin, Christian G., Floyd, Michael S., Stuecheli, Jeffrey, Chandramoorthy, Nandhini, Wellman, John-David, Buyuktosunoglu, Alper, Pflanz, Matthias, Sinharoy, Balaram, Bose, Pradip

المصدر: 2021 ACM/IEEE 48th Annual International Symposium on Computer Architecture (ISCA) ISCA Computer Architecture (ISCA), 2021 ACM/IEEE 48th Annual International Symposium on. :29-42 Jun, 2021

Relation: 2021 ACM/IEEE 48th Annual International Symposium on Computer Architecture (ISCA)

المؤلفون: Kochte, Michael A., Zoellin, Christian G., Baranowski, Rafal, Imhof, Michael E., Wunderlich, Hans-Joachim, Hatami, Nadereh, Carlo, Stefano Di, Prinetto, Paolo

المصدر: 2010 19th IEEE Asian Test Symposium Test Symposium (ATS), 2010 19th IEEE Asian. :3-8 Dec, 2010

Relation: 2010 19th Asian Test Symposium (ATS)

المؤلفون: Kochte, Michael A., Schaal, Marcel, Wunderlich, Hans-Joachim, Zoellin, Christian G.

المصدر: Design Automation Conference Design Automation Conference (DAC), 2010 47th ACM/IEEE. :380-385 Jun, 2010

Relation: 2010 47th ACM/EDAC/IEEE Design Automation Conference (DAC)

المؤلفون: Zoellin, Christian G., Wunderlich, Hans-Joachim

المصدر: 2010 28th VLSI Test Symposium (VTS) VLSI Test Symposium (VTS), 2010 28th. :93-98 Apr, 2010

Relation: 2010 28th VLSI Test Symposium (VTS)

المؤلفون: Kochte, Michael A., Zoellin, Christian G., Wunderlich, Hans-Joachim

المصدر: 2009 14th IEEE European Test Symposium Test Symposium, 2009 14th IEEE European. :53-58 May, 2009

Relation: 2009 14th IEEE European Test Symposium (ETS)

المؤلفون: Kochte, Michael A., Zoellin, Christian G., Imhof, Michael E., Khaligh, Rauf Salimi, Radetzki, Martin, Wunderlich, Hans-Joachim, Di Carlo, Stefano, Prinetto, Paolo

المصدر: 2009 Design, Automation & Test in Europe Conference & Exhibition Design, Automation & Test in Europe Conference & Exhibition, 2009. DATE '09.. :1250-1253 Apr, 2009

Relation: 2009 Design, Automation & Test in Europe Conference & Exhibition (DATE)

المؤلفون: Imhof, Michael E., Wunderlich, Hans-Joachim, Zoellin, Christian G.

المصدر: 2008 14th IEEE International On-Line Testing Symposium On-Line Testing Symposium, 2008. IOLTS '08. 14th IEEE International. :59-64 Jul, 2008

Relation: 2008 14th IEEE International On-Line Testing Symposium (IOLTS)

المؤلفون: Elm, Melanie, Wunderlich, Hans-Joachim, Imhof, Michael E., Zoellin, Christian G., Leenstra, Jens, Maeding, Nicolas

المصدر: 2008 45th ACM/IEEE Design Automation Conference Design Automation Conference, 2008. DAC 2008. 45th ACM/IEEE. :828-833 Jun, 2008

Relation: 2008 45th ACM/EDAC/IEEE Design Automation Conference (DAC)

المؤلفون: Zoellin, Christian G., Wunderlich, Hans-Joachim, Polian, Ilia, Becker, Bernd

المصدر: 2008 13th European Test Symposium Test Symposium, 2008 13th European. :185-190 May, 2008

Relation: 2008 13th IEEE European Test Symposium (ETS)

المؤلفون: Kochte, Michael A., Zoellin, Christian G., Imhof, Michael E., Wunderlich, Hans-Joachim

المصدر: 4th IEEE International Symposium on Electronic Design, Test and Applications (delta 2008) Electronic Design, Test and Applications, 2008. DELTA 2008. 4th IEEE International Symposium on. :581-586 Jan, 2008

Relation: 4th IEEE International Symposium on Electronic Design, Test and Applications