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1مؤتمر
المؤلفون: Zompanti, Alessandro, Cicco, Riccardo, Ciarrocchi, Davide, Santonico, Marco, Pennazza, Giorgio
المصدر: 2023 9th International Workshop on Advances in Sensors and Interfaces (IWASI) Advances in Sensors and Interfaces (IWASI), 2023 9th International Workshop on. :86-90 Jun, 2023
Relation: 2023 9th International Workshop on Advances in Sensors and Interfaces (IWASI)
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2مؤتمر
المؤلفون: Leoni, Alfiero, Ferri, Giuseppe, Ursini, Daniele, Zompanti, Alessandro, Sabatini, Anna, Stornelli, Vincenzo
المصدر: 2022 29th IEEE International Conference on Electronics, Circuits and Systems (ICECS) Electronics, Circuits and Systems (ICECS), 2022 29th IEEE International Conference on. :1-4 Oct, 2022
Relation: 2022 29th IEEE International Conference on Electronics, Circuits and Systems (ICECS)
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3مؤتمر
المؤلفون: Zompanti, Alessandro, Pennazza, Giorgio, Sabatini, Anna, Grasso, Simone, Mortella, Antonio, Santonico, Marco
المصدر: 2022 IEEE International Symposium on Olfaction and Electronic Nose (ISOEN) Olfaction and Electronic Nose (ISOEN), 2022 IEEE International Symposium on. :1-3 May, 2022
Relation: 2022 IEEE International Symposium on Olfaction and Electronic Nose (ISOEN)
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4كتاب إلكتروني
المؤلفون: Zompanti, AlessandroAff38, Santonico, MarcoAff38, Aff39, Pennazza, GiorgioAff38
المساهمون: Angrisani, Leopoldo, Series EditorAff1, Arteaga, Marco, Series EditorAff2, Chakraborty, Samarjit, Series EditorAff3, Chen, Jiming, Series EditorAff4, Chen, Shanben, Series EditorAff5, Chen, Tan Kay, Series EditorAff6, Dillmann, Rüdiger, Series EditorAff7, Duan, Haibin, Series EditorAff8, Ferrari, Gianluigi, Series EditorAff9, Ferre, Manuel, Series EditorAff10, Jabbari, Faryar, Series EditorAff11, Jia, Limin, Series EditorAff12, Kacprzyk, Janusz, Series EditorAff13, Khamis, Alaa, Series EditorAff14, Kroeger, Torsten, Series EditorAff15, Li, Yong, Series EditorAff16, Liang, Qilian, Series EditorAff17, Martín, Ferran, Series EditorAff18, Ming, Tan Cher, Series EditorAff19, Minker, Wolfgang, Series EditorAff20, Misra, Pradeep, Series EditorAff21, Mukhopadhyay, Subhas, Series EditorAff22, Ning, Cun-Zheng, Series EditorAff23, Nishida, Toyoaki, Series EditorAff24, Oneto, Luca, Series EditorAff25, Panigrahi, Bijaya Ketan, Series EditorAff26, Pascucci, Federica, Series EditorAff27, Qin, Yong, Series EditorAff28, Seng, Gan Woon, Series EditorAff29, Speidel, Joachim, Series EditorAff30, Veiga, Germano, Series EditorAff31, Wu, Haitao, Series EditorAff32, Zamboni, Walter, Series EditorAff33, Zhang, Junjie James, Series EditorAff34, Tan, Kay Chen, Series EditorAff35, Ciofi, Carmine, editorAff36, Limiti, Ernesto, editorAff37
المصدر: Proceedings of SIE 2023 : 54th Annual Meeting of the Italian Electronics Society. 1113:166-172
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5مؤتمر
المؤلفون: Sorvillo, Riccardo, Bacco, Luca, Merone, Mario, Zompanti, Alessandro, Santonico, Marco, Pennazza, Giorgio, Iannello, Giulio
المصدر: 2021 IEEE International Workshop on Metrology for Industry 4.0 & IoT (MetroInd4.0&IoT) Metrology for Industry 4.0 & IoT (MetroInd4.0&IoT), 2021 IEEE International Workshop on. :538-543 Jun, 2021
Relation: 2021 IEEE International Workshop on Metrology for Industry 4.0 & IoT (MetroInd4.0&IoT)
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6دورية أكاديمية
المؤلفون: T. C. Tonto, S. Cimini, S. Grasso, A. Zompanti, M. Santonico, L. De Gara, V. Locato
المصدر: Scientific Reports, Vol 13, Iss 1, Pp 1-13 (2023)
وصف الملف: electronic resource
Relation: https://doaj.org/toc/2045-2322
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7دورية أكاديمية
المؤلفون: Tonto, T. C., Cimini, S., Grasso, S., Zompanti, A., Santonico, M., De Gara, L., Locato, V.Aff1, IDs41598023478734_cor7
المصدر: Scientific Reports. 13(1)
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8مؤتمر
المؤلفون: Lapadula, V., Sabatini, A., Zompanti, A., Buscaglione, S., Lanaro, D., Merone, M.
المصدر: 2020 IEEE International Workshop on Metrology for Industry 4.0 & IoT Metrology for Industry 4.0 & IoT, 2020 IEEE International Workshop on. :507-510 Jun, 2020
Relation: 2020 IEEE International Workshop on Metrology for Industry 4.0 & IoT (MetroInd4.0&IoT)
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9مؤتمر
المؤلفون: Zompanti, Alessandro, Sabatini, Anna, Cesaro, Valeria, Grasso, Simone, Pennazza, Giorgio, Santonico, Marco, D'Amico, Arnaldo
المصدر: 2020 IEEE International Workshop on Metrology for Industry 4.0 & IoT Metrology for Industry 4.0 & IoT, 2020 IEEE International Workshop on. :207-212 Jun, 2020
Relation: 2020 IEEE International Workshop on Metrology for Industry 4.0 & IoT (MetroInd4.0&IoT)
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10مؤتمر
المصدر: 2020 IEEE International Workshop on Metrology for Industry 4.0 & IoT Metrology for Industry 4.0 & IoT, 2020 IEEE International Workshop on. :80-83 Jun, 2020
Relation: 2020 IEEE International Workshop on Metrology for Industry 4.0 & IoT (MetroInd4.0&IoT)